X-Ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, Würzburg, August 19–23, 1996
Editat de Jürgen Thieme, Günter Schmahl, Dietbert Rudolph, Eberhard Umbachen Limba Engleză Paperback – 23 aug 2014
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Specificații
ISBN-13: 9783642721083
ISBN-10: 3642721087
Pagini: 408
Ilustrații: XIX, 383 p. 400 illus. With online files/update.
Dimensiuni: 155 x 235 x 25 mm
Greutate: 0.57 kg
Ediția:1998
Editura: Springer Berlin, Heidelberg
Colecția Springer
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 3642721087
Pagini: 408
Ilustrații: XIX, 383 p. 400 illus. With online files/update.
Dimensiuni: 155 x 235 x 25 mm
Greutate: 0.57 kg
Ediția:1998
Editura: Springer Berlin, Heidelberg
Colecția Springer
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchCuprins
X-Ray Microscopy Projects.- X-Ray Microscopy Applications.- Microspectroscopy and Spectromicroscopy.- X-Ray Optics.- X-Ray Sources.
Textul de pe ultima copertă
This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities in a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. The book appeals to researchers who are active in microscopic and spectromicroscopic studies.
Caracteristici
This book is a status report on the newly developed technique of X-ray microscopy