X-Ray Photoelectron Spectroscopy of Solid Surfaces
Autor V.I. Nefedoven Limba Engleză Hardback – dec 1988
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Specificații
ISBN-13: 9789067640800
ISBN-10: 9067640808
Pagini: 200
Dimensiuni: 156 x 234 mm
Greutate: 0.48 kg
Ediția:1
Editura: CRC Press
Colecția CRC Press
ISBN-10: 9067640808
Pagini: 200
Dimensiuni: 156 x 234 mm
Greutate: 0.48 kg
Ediția:1
Editura: CRC Press
Colecția CRC Press
Public țintă
AcademicCuprins
Preface CHAPTER 1. BINDING ENERGY OF INNER ELECTRONS AND IDENTIFICATION OF CHEMICAL COMPOUNDS Physical principles and experimental techniques of X-ray photoelectron spectroscopy Specimen charging and spectrum calibration Patterns in values and identification of chemical compounds Relationship of to effective atomic charge and other characteristics References CHAPTER 2. LINE INTENSITY AND QUANTITATIVE ANALYSIS Dependence of intensity of X-ray photoelectron lines on various factors Mean free path of photoelectrons in a solid Quantitative surface analysis of solids References CHAPTER 3. ION SPUTTERING AND IN-DEPTH ANALYSIS Factors influencing sputtering speed Influence of ion bombardment on concentration profile of elements under examination Ion sputtering and alloy analysis Changes in chemical compounds under the effect of ion sputtering References CHAPTER 4. STUDY OF ADSORPTION AND CATALYSTS X-ray photoelectron study of the adsorption of molecules on metals Application of the angular dependence of intensities in studying adsorbed molecules Study of catalysts References CHAPTER 5. STUDIES OF THE SURFACE AND PROCESSES ON THE SURFACE Surface electron states Binding energy differences between atoms in bulk and on the surface Study of corrosion and alloy oxidation Semiconductor surface oxidation Study of fracture surfaces and alloy ageing Study of glasses Analysis of the surface of minerals: flotation XPS analysis of lunar regolith Study of adhesion Study of radiation damage Study of diffusion References SUPPLEMENT
Notă biografică
Vadim I. Nefedov Institute of General Inorganic Chemistry, Academy of Sciences of USSR, Moscow, USSR
Descriere
This volume outlines the physical and methodical concepts of X-ray photoelectron spectroscopy (XPS) specifically for surface studies using both inner and valence electron levels