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X-Ray Spectroscopy: An Introduction: Springer Series in Optical Sciences, cartea 15

Autor Bipin K. Agarwal
en Limba Engleză Paperback – 10 oct 1991

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Specificații

ISBN-13: 9783540507192
ISBN-10: 3540507191
Pagini: 440
Ilustrații: XV, 421 p. 18 illus.
Dimensiuni: 155 x 235 x 23 mm
Greutate: 0.61 kg
Ediția:2nd ed.
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Series in Optical Sciences

Locul publicării:Berlin, Heidelberg, Germany

Public țintă

Lower undergraduate

Cuprins

Content.- 1. Continuous X-Rays.- 2. Characteristic X-Rays.- 3. Interaction of X-Rays with Matter.- 4. Secondary Spectra and Satellites.- 5. Scattering of X-Rays.- 6. Chemical Shifts in Emission Spectra.- 7. Absorption Spectra.- 8. Soft X-Ray Spectroscopy.- 9. Experimental Methods.- Appendix A Rutherford Scattering for an Attractive Field.- A.1 Equation of Hyperbola.- A.2 Rutherford Scattering.- Appendix B Bohr’s Formula for Energy Loss.- Appendix C X-Ray Atomic Energy Levels.- Appendix D Electron Distribution Among the Levels of Free Atoms.- Appendix E Curves Representing Values of Electron Energies.- Appendix F Dipole Sum Rule.- Appendix G Screening Effect, According to Slater.- Appendix H Electronegativity Scale.- Appendix I Common Analyzing Crystals.- Appendix J Wavelength Tables.- References.- Author Index.