3D Integration of Resistive Switching Memory: Frontiers in Semiconductor Technology
Editat de Qing Luoen Limba Engleză Paperback – 19 dec 2024
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Specificații
ISBN-13: 9781032489506
ISBN-10: 1032489502
Pagini: 98
Dimensiuni: 216 x 138 x 11 mm
Greutate: 0.13 kg
Editura: Taylor & Francis Ltd.
Seria Frontiers in Semiconductor Technology
ISBN-10: 1032489502
Pagini: 98
Dimensiuni: 216 x 138 x 11 mm
Greutate: 0.13 kg
Editura: Taylor & Francis Ltd.
Seria Frontiers in Semiconductor Technology
Cuprins
1. Introduction
Qing Luo
2.Associative Problems in Crossbar array and 3D architectures
Qing Luo
3. Selector Devices and Self-selective cells
Yaxin Ding, Qing Luo
4. Integration of 3D RRAM
Qing Luo
5. Reliability issues of the 3D Vertical RRAM
Tiancheng Gong, Dengyun Lei
6. Applications of 3D RRAM Beyond Storage
Xumeng Zhang, Xiaoxin Xu, Jianguo Yang
7. Conclusion
Qing Luo
Qing Luo
2.Associative Problems in Crossbar array and 3D architectures
Qing Luo
3. Selector Devices and Self-selective cells
Yaxin Ding, Qing Luo
4. Integration of 3D RRAM
Qing Luo
5. Reliability issues of the 3D Vertical RRAM
Tiancheng Gong, Dengyun Lei
6. Applications of 3D RRAM Beyond Storage
Xumeng Zhang, Xiaoxin Xu, Jianguo Yang
7. Conclusion
Qing Luo
Notă biografică
Qing Luo received his Ph.D. from the Institute of Microelectronics, Chinese Academy of Sciences (IMECAS), Beijing, China, in 2017. He is currently Professor at the Key Laboratory of Microelectronics Devices and Integrated Technology in IMECAS. His research interests are emerging memory devices including resistive RAM devices and ferroelectric memory devices.