A Beginners' Guide to Scanning Electron Microscopy
Autor Anwar Ul-Hamiden Limba Engleză Hardback – 11 noi 2018
This
book
was
developed
with
the
goal
of
providing
an
easily
understood
text
for
those
users
of
the
scanning
electron
microscope
(SEM)
who
have
little
or
no
background
in
the
area.
The
SEM
is
routinely
used
to
study
the
surface
structure
and
chemistry
of
a
wide
range
of
biological
and
synthetic
materials
at
the
micrometer
to
nanometer
scale.
Ease-of-use,
typically
facile
sample
preparation,
and
straightforward
image
interpretation,
combined
with
high
resolution,
high
depth
of
field,
and
the
ability
to
undertake
microchemical
and
crystallographic
analysis,
has
made
scanning
electron
microscopy
one
of
the
most
powerful
and
versatile
techniques
for
characterization
today.
Indeed,
the
SEM
is
a
vital
tool
for
the
characterization
of
nanostructured
materials
and
the
development
of
nanotechnology.
However,
its
wide
use
by
professionals
with
diverse
technical
backgrounds—including
life
science,
materials
science,
engineering,
forensics,
mineralogy,
etc.,
and
in
various
sectors
of
government,
industry,
and
academia—emphasizes
the
need
for
an
introductory
text
providing
the
basics
of
effective
SEM
imaging.
A
Beginners’
Guide
to
Scanning
Electron
Microscopy
explains
instrumentation,
operation,
image
interpretation
and
sample
preparation
in
a
wide
ranging
yet
succinct
and
practical
text,
treating
the
essential
theory
of
specimen-beam
interaction
and
image
formation
in
a
manner
that
can
be
effortlessly
comprehended
by
the
novice
SEM
user.
This
book
- provides
a
concise
and
accessible
introduction
to
the
essentials
of
SEM
- includes
a
large
number
of
illustrations
specifically
chosen
to
aid
readers'
understanding
of
key
concepts
- highlights
recent
advances
in
instrumentation,
imaging
and
sample
preparation
techniques
- offers
examples
drawn
from
a
variety
of
applications
that
appeal
to
professionals
from
diverse
backgrounds.
| Toate formatele și edițiile | Preț | Express |
|---|---|---|
| Paperback (1) | 878.05 lei 6-8 săpt. | |
| Springer International Publishing – 19 ian 2019 | 878.05 lei 6-8 săpt. | |
| Hardback (1) | 884.08 lei 6-8 săpt. | |
| Springer – 11 noi 2018 | 884.08 lei 6-8 săpt. |
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Specificații
ISBN-13: 9783319984810
ISBN-10: 3319984810
Pagini: 434
Dimensiuni: 155 x 235 x 26 mm
Greutate: 0.77 kg
Ediția:1st ed. 2018
Editura: Springer
Colecția Springer
Locul publicării:Cham, Switzerland
ISBN-10: 3319984810
Pagini: 434
Dimensiuni: 155 x 235 x 26 mm
Greutate: 0.77 kg
Ediția:1st ed. 2018
Editura: Springer
Colecția Springer
Locul publicării:Cham, Switzerland
Cuprins
Introduction.-
What
is
the
SEM.-
Image
Resolution
in
the
SEM.-
Image
Formation
in
the
SEM.-
Information
obtained
using
the
SEM.-
Brief
History
of
the
SEM
Development.-
Components
of
the
SEM.-
Primary
Components.-
Electron
Column.-
Electron
Gun.-
Thermionic
Emission
Electron
Guns.-
Tungsten
Filament
Guns.-
Lanthalum
Hexaboride
(LaB6)
Emitter
Guns.-
Field
Emission
Electron
Guns.-
Electromagnetic
Lenses.-
Condenser
Lenses.-
Objective
Lenses.-
Pinhole
Lens.-
Immersion
Lens.-
Snorkel
Lens.-
Lens
Aberrations.-
Spherical
Aberration.-
Chromatic
Aberration.-
Astigmatism.-
Scan
Coils.-
Objective
Aperture.-
Specimen
Chamber.-
Specimen
Stage.-
CCD
Camera.-
Detectors.-
Secondary
Electron
Detector
(SED).-
Backscattered
Electron
Detector
(BSED).-
Energy
Dispersive
X-ray
Spectrometer
(EDS
Detector).-
Low
Vacuum
Detector.-
Low
Voltage
High
Contrast
Detector.-
Through-the-lens
Detector.-
Electron
Backscattered
Diffraction
(EBSD)
Detector.-
Scanning
Transmission
Electron
Microscopy
(STEM)
Detector.-
Computer
Control
System.-
Secondary
Components.-
Vacuum
System.-
Chiller.-
Heater.-
Electronics.-
Anti-Vibration
Platform.-
Specialized
Equipment.-
Focused
Ion
Beam
(FIB)
Instrument.-
Combined
Focused
Ion
Beam-Scanning
Electron
Microscope.-
Beam-Specimen
Interaction.-
Atom
Model.-
Elastic
Scattering.-
Inelastic
Scattering.-
Effect
of
Electron
Scattering.-
Interaction
Volume.-
Electron
Range.-
Signals
Obtained
From
the
Specimen.-
Backscattered
Electrons.-
Secondary
Electrons.-
Characteristic
X-Ray
Lines.-
White
Radiation.-
X-Ray
Fluorescence.-
Cathodoluminescence
Radiation.-
Imaging
with
the
SEM.-
Image
Formation
in
the
SEM.-
Magnification.-
Resolution.-
Depth
of
Field.-
Contrast.-
Secondary
Electron
Imaging.-
Backscattered
Electron
Imaging.-
Influence
of
Various
Factors
on
SEM
Imaging.-
Effect
of
Accelerating
Voltage.-
Effect
of
Probe
Current.-
Effect
of
Working
Distance.-
Effect
of
Objective
Aperture.-
Effect
of
Tilt.-
Astigmatism.-
Image
Distortion.-
Incorrect
Alignment.-
Beam
Damage.-
Charging.-
Edge
Effect.-
Sample
direction
with
respect
to
the
Detector
Position.-
Factors
affecting
Image
Quality:
Indications-Causes-Remedies.-
Summary
of
Specialized
Imaging
Techniques.-
Imaging
at
Low
Vacuum.-
Imaging
at
Low
Voltage.-
Environmental
SEM.-
Imaging
at
Low/Elevated
Temperature.-
Imaging
Samples
under
Stress.-
Use
of
Tilt
and
Rotation
during
Imaging.-
Use
of
STEM
detector
in
SEM.-
Use
of
EBSD
in
SEM.-
SEM
Operation.-
Specimen
Insertion.-
Image
Acquisition.-
Microscope
Alignment.-
Image
Quality.-
High
Resolution
Imaging.-
Maintenance
of
the
SEM.-
Microchemical
Analysis
with
the
SEM.-
Working
of
the
EDS
Detector.-
Characteristics
of
the
EDS
Detector.-
Qualitative
EDS
Analysis.-
Quantitative
EDS
Analysis.-
Atomic
Number
(Z)
Effect.-
X-ray
Absorption
(A)
Effect.-
X-ray
Fluorescence
(F)
Effect.-
ZAF
Corrections.-
Standardless
Analysis.-
Trace
Element
Analysis.-
Sample
Preparation.-
Metals,
Alloys,
Ceramics
and
Semiconductors.-
Polymers.-
Geological
Samples.-
Biological
Samples.-
Semiconductors.-
Use
of
Focused
Ion
Beam.
Notă biografică
Anwar
Ul-Hamid
received
his B.Sc.
in
Metallurgical
Engineering
and
Materials
Science
at
the University
of
Engineering
&
Technology
in
Lahore,
Pakistan
in
1991.
He
received
his
Ph.D,.
for Oxidation
of
High
Temperature
alloys/Analytical
Electron
Microscopy
at
the
Department
of
Materials
Science
&
Metallurgy
at
the
University
of
Cambridge
in
1996.
He
has
published
over
70
peer-reviewed
papers
in
journals
and
proceedings,
and
is
currently
Coordinator
of
the
Materials
Characterization
Laboratory
(MCL)/Research
Institute
at
King
Fahd
University
of
Petroleum
&
Minerals,
in
Dhahran,
Saudi
Arabia.
Textul de pe ultima copertă
This
book
was
developed
with
the
goal
of
providing
an
easily
understood
text
for
those
users
of
the
scanning
electron
microscope
(SEM)
who
have
little
or
no
background
in
the
area.
The
SEM
is
routinely
used
to
study
the
surface
structure
and
chemistry
of
a
wide
range
of
biological
and
synthetic
materials
at
the
micrometer
to
nanometer
scale.
Ease-of-use,
typically
facile
sample
preparation,
and
straightforward
image
interpretation,
combined
with
high
resolution,
high
depth
of
field,
and
the
ability
to
undertake
microchemical
and
crystallographic
analysis,
has
made
scanning
electron
microscopy
one
of
the
most
powerful
and
versatile
techniques
for
characterization
today.
Indeed,
the
SEM
is
a
vital
tool
for
the
characterization
of
nanostructured
materials
and
the
development
of
nanotechnology.
However,
its
wide
use
by
professionals
with
diverse
technical
backgrounds—including
life
science,
materials
science,
engineering,
forensics,
mineralogy,
etc.,
and
in
various
sectors
of
government,
industry,
and
academia—emphasizes
the
need
for
an
introductory
text
providing
the
basics
of
effective
SEM
imaging.
A
Beginners’
Guide
to
Scanning
Electron
Microscopy
explains
instrumentation,
operation,
image
interpretation
and
sample
preparation
in
a
wide
ranging
yet
succinct
and
practical
text,
treating
the
essential
theory
of
specimen-beam
interaction
and
image
formation
in
a
manner
that
can
be
effortlessly
comprehended
by
the
novice
SEM
user.
This
book
- provides
a
concise
and
accessible
introduction
to
the
essentials
of
SEM
- includes
a
large
number
of
illustrations
specifically
chosen
to
aid
readers'
understanding
of
key
concepts
- highlights
recent
advances
in
instrumentation,
imaging
and
sample
preparation
techniques
- offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds.
Caracteristici
Provides
a
concise
and
accessible
introduction
to
the
essentials
of
SEM
Includes
a
large
number
of
illustrations
specifically
chosen
to
aid
readers'
understanding
of
key
concepts
Highlights
recent
advances
in
instrumentation,
imaging
and
sample
preparation
techniques
Offers
examples
drawn
from
a
variety
of
applications
that
appeal
to
professionals
from
diverse
backgrounds