Advanced Materials for Radiation Detection
Editat de Krzysztof (Kris) Iniewskien Limba Engleză Paperback – 7 aug 2022
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Specificații
ISBN-13: 9783030764630
ISBN-10: 303076463X
Pagini: 356
Ilustrații: VII, 356 p. 150 illus., 119 illus. in color.
Dimensiuni: 155 x 235 mm
Greutate: 0.51 kg
Ediția:1st ed. 2022
Editura: Springer International Publishing
Colecția Springer
Locul publicării:Cham, Switzerland
ISBN-10: 303076463X
Pagini: 356
Ilustrații: VII, 356 p. 150 illus., 119 illus. in color.
Dimensiuni: 155 x 235 mm
Greutate: 0.51 kg
Ediția:1st ed. 2022
Editura: Springer International Publishing
Colecția Springer
Locul publicării:Cham, Switzerland
Cuprins
Chapter1. Radiation Detection Materials Introduction.- Chapter2. Inorganic Perovskite CsPbBr3 Gamma-ray Detector.- Chapter3. The Impact of Detection Volume on Hybrid Halide Perovskite-Based Radiation Detectors.- Chapter4. Cs-based Perovskite Thin Films For Neutron Detection.- Chapter5. Radiation Detection Technologies Enabled by Halide Perovskite Single Crystals.- Chapter6. Metal Halide Perovskites for High Energy Radiation Detection.- Chapter7. Thallium Based Materials for Radiation Detection.- Chapter8. CdZnTeSe: A promising material for radiation detector applications.- Chapter9. Radiation detection using n-type 4H-SiC Epitaxial Layer Surface Barrier Detectors.- Chapter10. Room-Temperature Radiation Detectors Based on Large-Volume CdZnTe Single Crystals.- Chapter11. Phase Diagram, Melt Growth and Characterization of Cd0.8Zn0.2Te Crystals for X-Ray Detector.- Chapter12. Melt growth of high resolution CdZnTe detectors.- Chapter13. Solution Growth of CdZnTe Crystals for X-Ray Detector.- Chapter14. Laser-Induced Transient Currents in Radiation Detector Materials.- Chapter15. Cadmium Zinc Telluride detectors for safeguards applications.
Notă biografică
Krzysztof (Kris) Iniewski is managing R&D development activities at Redlen Technologies Inc., a detector company based in British Columbia, Canada. During his 15 years at Redlen he has managed development of highly integrated CZT detector products in medical imaging and security applications. Prior to Redlen Kris hold various management and academic positions at PMC-Sierra, University of Alberta, SFU, UBC and University of Toronto.
Dr. Iniewski has published over 150+ research papers in international journals and conferences. He holds 20+ international patents granted in USA, Canada, France, Germany, and Japan. He wrote and edited several books for Wiley, Cambridge University Press, Mc-Graw Hill, CRC Press and Springer. He is a frequent invited speaker and has consulted for multiple organizations internationally.
Dr. Iniewski has published over 150+ research papers in international journals and conferences. He holds 20+ international patents granted in USA, Canada, France, Germany, and Japan. He wrote and edited several books for Wiley, Cambridge University Press, Mc-Graw Hill, CRC Press and Springer. He is a frequent invited speaker and has consulted for multiple organizations internationally.
Textul de pe ultima copertă
This book offers readers an overview of some of the most recent advances in the field of advanced materials used for gamma and X-ray imaging. Coverage includes both technology and applications, with an in-depth review of the research topics from leading specialists in the field. Emphasis is on high-Z materials like CdTe, CZT and GaAs, as well as perovskite crystals, since they offer the best implementation possibilities for direct conversion X-ray detectors. Authors discuss material challenges, detector operation physics and technology and readout integrated circuits required to detect signals processes by high-Z sensors.
- Provides coverage of a broad range of topics, from international experts in academia and industry;
- Includes in-depth analysis of how to optimize X-ray detection and electronics for X-ray detection;
- Covers both technology and applications in a number of different domains.
Caracteristici
Provides coverage of a broad range of topics, from international experts in academia and industry Includes in-depth analysis of how to optimize X-ray detection and electronics for X-ray detection Covers both technology and applications in a number of different domains