Advances in Materials Characterization II: Materials Science Research, cartea 19
Editat de R. L. Snyderen Limba Engleză Paperback – 15 feb 2012
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Specificații
ISBN-13: 9781461594413
ISBN-10: 1461594413
Pagini: 432
Ilustrații: XII, 416 p.
Dimensiuni: 178 x 254 x 23 mm
Greutate: 0.74 kg
Ediția:Softcover reprint of the original 1st ed. 1985
Editura: Springer Us
Colecția Springer
Seria Materials Science Research
Locul publicării:New York, NY, United States
ISBN-10: 1461594413
Pagini: 432
Ilustrații: XII, 416 p.
Dimensiuni: 178 x 254 x 23 mm
Greutate: 0.74 kg
Ediția:Softcover reprint of the original 1st ed. 1985
Editura: Springer Us
Colecția Springer
Seria Materials Science Research
Locul publicării:New York, NY, United States
Public țintă
ResearchCuprins
Structural and Elemental Characterization.- NMR Characterization of Glasses.- Application of Inductively Coupled Plasma Spectrometry for the Analysis of Ceramics and Glasses.- Raman Spectra and Structure of Fluorine- and Water-bearing Silicate Glasses and Melts.- Simultaneous Crystallite Size, Strain and Structure Analysis from X-ray powder Diffraction Pattern.- The Infrared and Raman Spectra of Phosphorosilicate Phases With 1:1 SiO2/P2O5 Molar Ratios.- Measurement of Nonstoichiometry in BaTiO3 Using Raman Spectroscopy.- Reststrahlen Effects in DRIFT Experiments for NaCl in the Far-Infrared Region.- Phase Characterization.- Newer Techniques in Optical Microscopy.- Laser Raman Microprobe Study of the Identification and Thermal Transformations of Some Carbonate and Aluminosilicate Minerals.- Sample Characteristics Affecting Quantitative Analysis by X-ray Powder Diffraction.- Laser Raman Microprobe Characterization of Fly Ash.- Raman and Luminescence Spectroscopy of Zirconium Oxide with the use of the Mole Microprobe.- Surface and Interface Characterization.- High Resolution Electron Microscopic Characterization of Interfaces in Ceramics.- Characterization of Grain Boundaries in Alumina.- Surface Reactivity of Silica and Alumina Ceramic Powders.- Diffusion of Water in SiO2 at Low Temperature.- Spectroscopic Analysis of Molecular Surfaces by Ion, Photoelectron and Vibrational Spectroscopy.- Thermal Wave Imaging of Defects in Opaque Solids.- Studies of Adhesion Failure Mechanisms at Metal-HgCdTe and ZnS-Ge Interfaces by SEM/SAM/EDX.- Electron Microscopic Studies of Plasma-Sprayed Coatings.- Microstructure Characterization.- Experimental and Theoretical Aspects of Frequency-Domain Photopyroelectric Spectroscopy of Condensed Phases (PPES), A New, Simple and Powerful Spectroscopic Technique.- Ultrasonic Flaw Detection in Model Ceramic Systems.- The Hygroscopic Behavior of SiO2 and SixOyClz Thin Films on Si using ATR FTIR Spectra.- A New FT-IR Technique for the in situ Study of the Mechanism of Solid State Materials Preparations.- Mercury Porosimetry of Dry Silica Gels.- Characterization of Microstructural Evolution by Mercury Porosimetry.- Electrical Characterization of Ceramics and Polymers.- Thermal Analysis of Organic Binders for Ceramic Processing.- The Thermal Diffusivity of Simulated Nuclear Waste Glass Below the Glass Transition Temperature.- Characterization of Matrix-Dispersoid Reactions in Si3N4-TiC Composites.- Kirlian Photography Material Science, Testing and Ichnology.