Advances in Reflectometric Sensing for Industrial Applications: Synthesis Lectures on Emerging Engineering Technologies
Autor Andrea Cataldo, Egidio De Benedetto, Giuseppe Cannazzaen Limba Engleză Paperback – 19 ian 2016
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Specificații
ISBN-13: 9783031794964
ISBN-10: 3031794966
Ilustrații: XI, 84 p.
Dimensiuni: 191 x 235 mm
Greutate: 0.19 kg
Editura: Springer International Publishing
Colecția Springer
Seria Synthesis Lectures on Emerging Engineering Technologies
Locul publicării:Cham, Switzerland
ISBN-10: 3031794966
Ilustrații: XI, 84 p.
Dimensiuni: 191 x 235 mm
Greutate: 0.19 kg
Editura: Springer International Publishing
Colecția Springer
Seria Synthesis Lectures on Emerging Engineering Technologies
Locul publicării:Cham, Switzerland
Cuprins
Preface.- Acknowledgments.- Introduction to Microwave Reflectometry.- Reflectometry for Leak Localization in Underground Pipes.- Reflectometry for Moisture Monitoring in Buildings.- Reflectometry for Liquid-Level Monitoring.- Authors' Biographies.
Notă biografică
Andrea Cataldo received an MS in materials engineering and a PhD in information engineering from the University of Lecce, Italy. From 2000-2004 he was with the University of Lecce working on research projects in the field of characterization of optoelectronic devices, telecommunication applications, and microwave measurements. Since 2005, he has been a faculty member with the Department of Engineering for Innovation, University of Salento, where he is currently an associate professor of electric and electronic measurements. He has coauthored more than 100 publications and is co-founder of MoniTech Ltd.Egidio De Benedetto received an MS in materials engineering and a PhD in information engineering from the University of Lecce, Italy. From 2010-2012 he was with the Institute of Microelectronics and Microsystems of the National Research Council in Italy. Since 2012, he has been a research fellow with the Department of Engineering for Innovation, University of Salento. His research interests include the characterization of devices through relectometric methods, the dielectric characterization of materials and microwave measurements.Giuseppe Cannazza received the Laurea degree in physics from the University of Lecce, Italy, in 2000 and an M.S. in material science and technology from the University of Pavia, Italy, in 2003. In 2001, he was a researcher with an international consulting company, where he worked in the environmental field. From 2003-2004, he was a technical advisor with a German company, where he worked on the development of an innovative measurement method for water content sensing in materials through low-resolution inside-out nuclear magnetic resonance. Since 2007, he has been with the Department of Engineering for Innovation, University of Salento, Lecce, Italy, where he is currently a Temporary Research Fellow. Mr. Cannazza's research interests include reflectometry and microwave measurement techniques, uncertainty evaluation, and characterization andoptimization of sensors for industrial applications.