Sustaining Moore’s Law: Uncertainty Leading to a Certainty of IoT Revolution: Synthesis Lectures on Emerging Engineering Technologies
Autor Apek Mulayen Limba Engleză Paperback – 14 sep 2015
Preț: 253.43 lei
Nou
Puncte Express: 380
Preț estimativ în valută:
48.50€ • 50.86$ • 40.44£
48.50€ • 50.86$ • 40.44£
Carte tipărită la comandă
Livrare economică 07-21 ianuarie 25
Preluare comenzi: 021 569.72.76
Specificații
ISBN-13: 9783031008979
ISBN-10: 3031008979
Ilustrații: XVII, 91 p.
Dimensiuni: 191 x 235 mm
Greutate: 0.2 kg
Editura: Springer International Publishing
Colecția Springer
Seria Synthesis Lectures on Emerging Engineering Technologies
Locul publicării:Cham, Switzerland
ISBN-10: 3031008979
Ilustrații: XVII, 91 p.
Dimensiuni: 191 x 235 mm
Greutate: 0.2 kg
Editura: Springer International Publishing
Colecția Springer
Seria Synthesis Lectures on Emerging Engineering Technologies
Locul publicării:Cham, Switzerland
Cuprins
Foreword.- Preface.- Acknowledgments.- Impacts of Moore's Law on Human Progress.- From an Unsustainable to a Sustainable Progress of Moore's Law.- Impacts of Semiconductor Business Models on U.S. National Interests.- Impacts of Semiconductor Business Models on Sustainability.- Macroeconomic Cycles and Business Models for the Progress of Moore's Law.- Would Economics End Moore's Law?.- Design of Supply Chains for the Success of the Internet of Things (IoT).- The Macroeconomics of 450 mm Wafers.- Moore's Law Beyond 50.- Macroeconomics of Semiconductor Manufacturing for Emerging Economies.- The Internet of Things (IoT) Revolution.- An Engagement with Semiconductor Industry Thought Leaders about the Future of the Semiconductor Industry.- Author's Biography .
Notă biografică
Apek Mulay is a business and technology consultant and author of two books, Mass Capitalism: A Blueprint for Economic Revival and Sustaining Moore's Law. He pursued undergraduate studies in electronics engineering at the University of Mumbai and completed his Master's Degree at Texas Tech University. He is sole author of a patent "Surface Imaging with Materials Identified by Colors," developed during his employment in Advanced CMOS technology at Texas Instruments, Inc. Mr. Mulay chaired technical sessions at the International Symposium for Testing and Failure Analysis (ISTFA) in 2009 and 2010. He has authored several articles showing a wide expertise in macroeconomics, geo-politics, supply chains, business models, socio-economics, and microeconomics; relating these to the capital-intensive semiconductor industry. You can read his blog at www.apekmulay.com.