Cantitate/Preț
Produs

Advances in X-Ray Analysis: Volume 38

Editat de D. K. Bowen, John V. Gilfrich, C.C. Goldsmith, Ting C. Huang, Ron Jenkins, I. Cev Noyan, Paul K. Predecki, Deane K. Smith
en Limba Engleză Hardback – 30 sep 1995
The 43rd Annual Conference on Applications ofX-ray Analysis was held August 1-5, 1994, at the Sheraton Steamboat Resort & Conference Center in Steamboat Springs, Colorado. The Denver X-Ray Conference has evolved from the 1950's into an international forum for the interaction of scientists, engineers and technologists interested in the use of x-rays in materials characterization. It has not only acted as a venue but has both stimulated and nurtured many of the principal developments in this field over the years. The major changes that have been occurring on the national and international scene as a result of the end of the cold war have dramatic-ally affected the way the materials community does business. The removal of defense priorities and development funds from most new materials initiatives has stimulated the char­ acterization communities to look to increasing the speed of their methods. This is being accom­ plished via the development of very fast dynamic characterization procedures which can rapidly and intelligently monitor and optimize the formation of a desired microstructure. The develop­ ment of intelligent characterization procedures applied in real-time during the manufacturing process can lead to the ability to design desired microstructures. Another potential advantage to this approach is its ability to characterize the actual amount of material which goes into a final product; permitting a rapid transition from R&D to manufacturing by avoiding the prob­ lems associated with scale-up.
Citește tot Restrânge

Preț: 181495 lei

Preț vechi: 221335 lei
-18% Nou

Puncte Express: 2722

Preț estimativ în valută:
34738 36108$ 28775£

Carte tipărită la comandă

Livrare economică 05-19 februarie 25

Preluare comenzi: 021 569.72.76

Specificații

ISBN-13: 9780306450457
ISBN-10: 0306450453
Pagini: 787
Ilustrații: XXVI, 787 p.
Dimensiuni: 178 x 254 x 51 mm
Greutate: 1.47 kg
Ediția:1995
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States

Public țintă

Research

Cuprins

I. Dynamic Characterization of Materials by Powder Diffraction.- II. Phase Analysis, Accuracy and Standards in Powder Diffraction.- III. Applications of Diffraction to Semiconductors and Films.- IV New Developments in X-Ray Sources, Instrumentation and Techniques.- V. Residual Stress, Crystallite Size and Rms Strain Determination by Diffraction Methods.- VI. Polymer Applications of X-Ray Scattering.- VII. Microbeam Xrd and Xrs Analysis.- VIII. In Vivo Applications of Xrs.- IX. Xrs Mathematical Methods, Trace Analysis and Other Applications.- X. Structural and Other Applications of Powder Diffraction.- Author Index.