Cantitate/Preț
Produs

Applied Charged Particle Optics

Autor Helmut Liebl
en Limba Engleză Hardback – 2 noi 2007
Authored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. Applied Charged Particle Optics begins by introducing electrostatic lenses and fields used for acceleration, focussing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. A chapter on applications is added.
Citește tot Restrânge

Toate formatele și edițiile

Toate formatele și edițiile Preț Express
Paperback (1) 59962 lei  6-8 săpt.
  Springer Berlin, Heidelberg – 15 oct 2010 59962 lei  6-8 săpt.
Hardback (1) 60537 lei  6-8 săpt.
  Springer Berlin, Heidelberg – 2 noi 2007 60537 lei  6-8 săpt.

Preț: 60537 lei

Preț vechi: 71219 lei
-15% Nou

Puncte Express: 908

Preț estimativ în valută:
11592 12539$ 9659£

Carte tipărită la comandă

Livrare economică 11-25 decembrie

Preluare comenzi: 021 569.72.76

Specificații

ISBN-13: 9783540719243
ISBN-10: 3540719245
Pagini: 144
Ilustrații: X, 131 p.
Dimensiuni: 210 x 297 x 14 mm
Greutate: 0.38 kg
Ediția:2008
Editura: Springer Berlin, Heidelberg
Colecția Springer
Locul publicării:Berlin, Heidelberg, Germany

Public țintă

Research

Cuprins

Lenses: Basic Optics.- Electrostatic Deflection.- Magnetic Deflection.- Image Aberrations.- Fringe Field Confinement.

Recenzii

From the reviews:
"This is a short book (128 pages) and follows the course notes of Liebl’s lecture: it is ‘intended to help physicists who have to design their own apparatus or to help them to better understand instruments they have to work with.’ … There are numerous clear diagrams and the book succeeds in its modest aim: to get beginners started in a fairly painless fashion." (Ultramicroscopy, Vol. 108, 2008)
"Book on charged particle optics will primarily be of interest to specialists in that field. … The presentation is commendably clear and readily accessible to anyone with a good knowledge of physics at degree level. … It will also be a fruitful source of examples of the application of electromagnetic theory to charged particles for those preparing lecture courses in the subject for physics degrees." (Richard Carter, Contemporary Physics, Vol. 50 (2), March-April, 2009)

Textul de pe ultima copertă

Authored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. Applied Charged Particle Optics begins by introducing electrostatic lenses and fields used for acceleration, focussing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. A chapter on applications is added.

Caracteristici

Features the basic knowledge for the construction of particle optics devices Provides detailed instructions on the design of particle lens systems A reference work for researchers, engineers and graduate students alike Includes supplementary material: sn.pub/extras