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Assessing Measurement Invariance for Applied Research: Educational and Psychological Testing in a Global Context

Autor Craig S. Wells
en Limba Engleză Paperback – 10 mai 2023
This book focuses on the practical application of statistical techniques for assessing measurement invariance with less emphasis on theoretical development or exposition. Instead, it describes the methods using a pedagogical framework followed by extensive illustrations that demonstrate how to use software to analyze real data. The chapters illustrate the practical methods to assess measurement invariance and shows how to apply them to a range of data. The computer syntax and data sets used in this book are available for download here: people.umass.edu/cswells.
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Specificații

ISBN-13: 9781108719278
ISBN-10: 1108719279
Pagini: 416
Dimensiuni: 228 x 152 x 25 mm
Greutate: 0.56 kg
Editura: Cambridge University Press
Colecția Cambridge University Press
Seria Educational and Psychological Testing in a Global Context

Locul publicării:New York, United States

Cuprins

1. Introduction; 2. Observed Score Methods; 3. Item Response Theory; 4. Methods Based on Item Response Theory; 5. Confirmatory Factor Analysis; 6. Methods Based on Confirmatory Factor Analysis; Appendix; Author Index; Subject Index.

Recenzii

'Measurement invariance has become a key concept in social sciences. Craig S. Well's book offers a comprehensive overview of MI approaches as well as practical examples, which will allow the reader to carry out measurement invariance studies in different contexts.' Paula Elosua Oliden, Professor of Psychometrics, University of the Basque Country, Spain
'The text provides a concise and clear treatment of the numerous approaches used to assess measurement invariance. With practitioners in mind, the examples with computer syntax and output support your ability to conduct and correctly interpret these analyses. Practitioners and students will benefit from reading this book.' Sara J. Finney, Professor of Graduate Psychology and Associate Director of the Center for Assessment and Research Studies, James Madison University, USA
'This volume in the International Test Commission series is a hands-on book for applied researchers. It does a good job in instructing readers to detect and interpret measurement invariance, an important topic in developing measures that are fair and appropriate for all.' Kurt F. Geisinger, W.C. Meierhenry Distinguished University Professor of Educational Psychology and Director of the Buros Center for Testing, University of Nebraska-Lincoln, USA
'This book is clear, well structured, practice-oriented, and grounded on theory and methodology. It will be a great help for students and researchers in the social sciences, education, and health sciences. The complementary website is also very useful for applying the techniques presented in the book. In short, it is a must-read.' José Muñiz, Professor of Psychometrics, University of Nebrija, Spain
'This is a comprehensive pedagogical guide to assessing measurement invariance and has wide appeal to researchers, practitioners, and graduate students. The book reads as if written by a seasoned teacher and I especially appreciate the data sets and computer software syntax, which allow you to practice the methods described.' Jennifer Randall, Associate Dean for Academic Affairs and Director of Evaluation for the Center for Educational Assessment, University of Massachusetts Amherst, USA
'The author certainly delivers on the promise of its title in providing comprehensive, yet accessible, guidance to those tasked with evaluating invariance in practice. It presents cogent and succinct descriptions of advanced measurement concepts, connecting the theory of these ideas to practical applications using numerous examples and data files.' April. L. Zenisky, Research Associate Professor of Educational Assessment, University of Massachusetts Amherst, USA

Notă biografică


Descriere

This user-friendly guide illustrates how to assess measurement invariance using computer programs, statistical methods, and real data.