Broadband Reflectometry for Enhanced Diagnostics and Monitoring Applications: Lecture Notes in Electrical Engineering, cartea 93
Autor Andrea Cataldo, Egidio De Benedetto, Giuseppe Cannazzaen Limba Engleză Paperback – 29 mai 2013
Starting from an extensive survey of the state of the art and from a clear and concise overview of the theoretical background, throughout the book, the different approaches of BMR are considered (i.e., time domain reflectometry - TDR, frequency domain reflectometry - FDR, and the TDR/FDR combined approach) and several applications are thoroughly investigated.
The applications considered herein are very diverse from each other and cover different fields. In all the described procedures and methods, the ultimate goal is to endow them with a significant performance enhancement in terms of measurement accuracy, low cost, versatility, and practical implementation possibility, so as to unlock the strong potential of BMR.
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Paperback (1) | 621.36 lei 6-8 săpt. | |
Springer Berlin, Heidelberg – 29 mai 2013 | 621.36 lei 6-8 săpt. | |
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Springer Berlin, Heidelberg – 27 mai 2011 | 627.11 lei 6-8 săpt. |
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Specificații
ISBN-13: 9783642267970
ISBN-10: 3642267971
Pagini: 168
Ilustrații: XVIII, 150 p.
Dimensiuni: 155 x 235 x 9 mm
Greutate: 0.25 kg
Ediția:2011
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Lecture Notes in Electrical Engineering
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 3642267971
Pagini: 168
Ilustrații: XVIII, 150 p.
Dimensiuni: 155 x 235 x 9 mm
Greutate: 0.25 kg
Ediția:2011
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Lecture Notes in Electrical Engineering
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchCuprins
Introduction.- Basic Physical Principles.- Broadband Reflectometry: Theoretical Background.- Quantitative and Qualitative Characterization of Liquid Materials.- Qualitative Characterization of Granular Materials and Moisture.- Measurements .- BMR Characterization of Antennas Through the Combined TD/FD.- Approach.
Textul de pe ultima copertă
This book is dedicated to the adoption of broadband microwave reflectometry (BMR)-based methods for diagnostics and monitoring applications. This electromagnetic technique has established as a powerful tool for monitoring purposes; in fact, it can balance several contrasting requirements, such as the versatility of the system, low implementation cost, real-time response, possibility of remote control, reliability, and adequate measurement accuracy.
Starting from an extensive survey of the state of the art and from a clear and concise overview of the theoretical background, throughout the book, the different approaches of BMR are considered (i.e., time domain reflectometry - TDR, frequency domain reflectometry - FDR, and the TDR/FDR combined approach) and several applications are thoroughly investigated.
The applications considered herein are very diverse from each other and cover different fields. In all the described procedures and methods, the ultimate goal is to endow them with a significant performance enhancement in terms of measurement accuracy, low cost, versatility, and practical implementation possibility, so as to unlock the strong potential of BMR.
Starting from an extensive survey of the state of the art and from a clear and concise overview of the theoretical background, throughout the book, the different approaches of BMR are considered (i.e., time domain reflectometry - TDR, frequency domain reflectometry - FDR, and the TDR/FDR combined approach) and several applications are thoroughly investigated.
The applications considered herein are very diverse from each other and cover different fields. In all the described procedures and methods, the ultimate goal is to endow them with a significant performance enhancement in terms of measurement accuracy, low cost, versatility, and practical implementation possibility, so as to unlock the strong potential of BMR.
Caracteristici
State of the art of microwave reflectometry based methods for diagnostics and monitoring applications Major practical applications of reflectometry and related results are discussed Written by leading experts in the field