Characterization of Advanced Materials
Editat de W. Altergott, E. Hennekeen Limba Engleză Paperback – 26 oct 2012
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Specificații
ISBN-13: 9781461366393
ISBN-10: 1461366399
Pagini: 196
Ilustrații: IX, 183 p.
Dimensiuni: 178 x 254 x 10 mm
Greutate: 0.35 kg
Ediția:1990
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
ISBN-10: 1461366399
Pagini: 196
Ilustrații: IX, 183 p.
Dimensiuni: 178 x 254 x 10 mm
Greutate: 0.35 kg
Ediția:1990
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
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Public țintă
ResearchCuprins
Stereo X-Ray Radiography of Composite Materials.- Application of X-Ray Computed Tomography to Ceramic/Ceramic Composites.- High Speed Heterodyne Holographic Interferometry.- Optical Fiber Waveguide Methods for Advanced Materials.- Adiabatic Thermography of Composite Materials.- Application of Scanning Acoustic Microscopy to Advanced Structural Ceramics.- TEM Studies of Semiconductor Materials.- The Characterization of New Austenitic Stainless Steels Highly Resistant to Cavitation-Erosion.- Characterization of Duplex Stainless Steels by TEM, SANS, and APFIM Techniques.- Characterization of Microstructures in Rapidly Solidified Alloys.- Characterization of Wear-Resistant Coatings and Surface Treatments.