Simulated Annealing Editat de Cher Ming Tan 31 aug 2008 Hardback Preț: 1002.77 lei 1253.47 lei 22-36 zile -20%
Electromigration in ULSI Interconnections: Modeling, Analysis and Numerical Simulations International Series on Advances in Solid State Electronics and Technology (Unnumbered) Autor Cher Ming Tan 24 iun 2010 Hardback Preț: 657.96 lei 774.07 lei 43-57 zile -15%
Reliability and Failure Analysis of High-Power LED Packaging Woodhead Publishing Series in Electronic and Optical Materials Autor Cher Ming Tan et al. 27 sep 2022 Paperback Preț: 1089.28 lei 1492.17 lei 43-57 zile -27%
Theory and Practice of Quality and Reliability Engineering in Asia Industry Editat de Cher Ming Tan et al. 26 ian 2017 Hardback Preț: 1223.74 lei 1492.37 lei 43-57 zile -18%
Electromigration Modeling at Circuit Layout Level SpringerBriefs in Applied Sciences and Technology Autor Cher Ming Tan et al. 4 mai 2013 Paperback Preț: 377.73 lei 43-57 zile
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections Springer Series in Reliability Engineering Autor Cher Ming Tan et al. 21 apr 2013 Paperback Preț: 633.53 lei 745.32 lei 43-57 zile -15%