Design of Energy-Efficient Application-Specific Instruction Set Processors
Autor Tilman Glökler, Heinrich Meyren Limba Engleză Paperback – 7 dec 2010
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Specificații
ISBN-13: 9781441954251
ISBN-10: 1441954252
Pagini: 256
Ilustrații: XX, 234 p.
Dimensiuni: 178 x 254 x 13 mm
Greutate: 0.36 kg
Ediția:Softcover reprint of the original 1st ed. 2004
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
ISBN-10: 1441954252
Pagini: 256
Ilustrații: XX, 234 p.
Dimensiuni: 178 x 254 x 13 mm
Greutate: 0.36 kg
Ediția:Softcover reprint of the original 1st ed. 2004
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
Public țintă
Professional/practitionerCuprins
Focus and Related Work.- Efficient Low-Power Hardware Design.- Application-Specific Processor Architectures.- The ASIP Design Flow.- The ASIP Design Environment.- Case Studies.- Summary.
Recenzii
From the reviews:
"This book deals with the basic principles of design methodology that addresses the aspects of ASIP performance and energy optimizations. … The chapters of the book are concise and well written. The book is timely and well organized. It clearly gives an adequate view of the currently hottest topics in ASIP design. … The book should be of considerable interest for graduate-level students in Electrical and Computer Engineering, researchers, and specialists … . I would certainly like to fully recommend this book … ." (Mile Stojcev, Microelectronics Reliability, Vol. 45, 2005)
"This book deals with the basic principles of design methodology that addresses the aspects of ASIP performance and energy optimizations. … The chapters of the book are concise and well written. The book is timely and well organized. It clearly gives an adequate view of the currently hottest topics in ASIP design. … The book should be of considerable interest for graduate-level students in Electrical and Computer Engineering, researchers, and specialists … . I would certainly like to fully recommend this book … ." (Mile Stojcev, Microelectronics Reliability, Vol. 45, 2005)