Diffraction from Materials: Materials Research and Engineering
Autor Lyle H. Schwartz, Jerome B. Cohenen Limba Engleză Paperback – 13 iul 2013
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Specificații
ISBN-13: 9783642829291
ISBN-10: 3642829295
Pagini: 612
Ilustrații: XV, 591 p. 109 illus.
Greutate: 0.96 kg
Ediția:Softcover reprint of the original 2nd ed. 1987
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Materials Research and Engineering
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 3642829295
Pagini: 612
Ilustrații: XV, 591 p. 109 illus.
Greutate: 0.96 kg
Ediția:Softcover reprint of the original 2nd ed. 1987
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Materials Research and Engineering
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchCuprins
1. Geometry of Crystal Structures.- 2. The Nature of Diffraction.- 3. Properties of Radiation Useful for Studying the Structure of Materials.- 4. Recording the Diffraction Pattern.- 5. Crystal Symmetry and the Diffraction Pattern.- 6. Determination of Crystal Structures.- 7. What Else Can We Learn from a Diffraction Experiment Besides the Average Structure?.- 8. The Dynamical Theory of Diffraction.- Appendix A: Location of Useful Information in International Tables for Crystallography.- Appendix B: Crystallographic Classification of the 230 Space Groups.- Appendix C: Determination of the Power of the Direct Beam in X-ray Diffraction.- Method 1: Aluminum Powder.- Method 2: Polystyrene.- Method 3: Multiple Foils.- Method 4: The Ionization Chamber.- References.- Appendix D: Accuracy in Digital Counting.- D.1 Some Additional Information on Counting Electronics.- D.2 Measurement of Dead Time.- Answers to Selected Problems.