Cantitate/Preț
Produs

Digital-Forensics and Watermarking: 13th International Workshop, IWDW 2014, Taipei, Taiwan, October 1-4, 2014. Revised Selected Papers: Lecture Notes in Computer Science, cartea 9023

Editat de Yun-Qing Shi, Hyoung Joong Kim, Fernando Pérez-González, Ching-Nung Yang
en Limba Engleză Paperback – 10 iun 2015
This book constitutes the thoroughly refereed post-conference proceedings of the 13th International Workshop on Digital-Forensics and Watermarking, IWDW 2014, held in Taipei, Taiwan, during October 2014.
The 32 full and 14 poster papers, presented together with 1 keynote speech, were carefully reviewed and selected from 79 submissions. The papers are organized in topical sections on forensics; watermarking; reversible data hiding; visual cryptography; and steganography and steganalysis.
Citește tot Restrânge

Din seria Lecture Notes in Computer Science

Preț: 38659 lei

Nou

Puncte Express: 580

Preț estimativ în valută:
7403 8012$ 6172£

Carte tipărită la comandă

Livrare economică 09-23 decembrie

Preluare comenzi: 021 569.72.76

Specificații

ISBN-13: 9783319193205
ISBN-10: 3319193201
Pagini: 626
Ilustrații: XIII, 626 p. 278 illus.
Dimensiuni: 155 x 235 x 38 mm
Greutate: 0.89 kg
Ediția:2015
Editura: Springer International Publishing
Colecția Springer
Seriile Lecture Notes in Computer Science, Security and Cryptology

Locul publicării:Cham, Switzerland

Public țintă

Research

Cuprins

Forensics.- Watermarking.- Reversible data hiding.- Visual cryptography.- Steganography and steganalysis.

Textul de pe ultima copertă

This book constitutes the thoroughly refereed post-proceedings of the 13th International Workshop on Digital-Forensics and Watermarking, IWDW 2014, held in Taipei, Taiwan, during October 2014. The 32 full and 14 poster papers, presented together with 1 keynote speech, were carefully reviewed and selected from 79 submissions. The papers are organized in topical sections on forensics; watermarking; reversible data hiding; visual cryptography; and steganography and steganalysis.

Caracteristici

Includes supplementary material: sn.pub/extras