Cantitate/Preț
Produs

Digital Memory and Storage

Autor Walter E. Proebster
de Limba Germană Paperback – 1978

Preț: 42354 lei

Preț vechi: 52942 lei
-20% Nou

Puncte Express: 635

Preț estimativ în valută:
8107 8431$ 6793£

Carte tipărită la comandă

Livrare economică 13-27 martie

Preluare comenzi: 021 569.72.76

Specificații

ISBN-13: 9783528084097
ISBN-10: 352808409X
Pagini: 432
Ilustrații: 423 S.
Dimensiuni: 152 x 229 x 23 mm
Greutate: 0.58 kg
Ediția:Softcover reprint of the original 1st ed. 1978
Editura: Vieweg+Teubner Verlag
Colecția Vieweg+Teubner Verlag
Locul publicării:Wiesbaden, Germany

Public țintă

Research

Cuprins

Keynote Address.- On the Development of Digital Memories.- Electromagnetic Storage.- Magnetic Data Recording.- Electromechanical Mass Storage Units — Disk Files.- Electromagnetic Mass Storages — Normal Tape Devices 53.- Tape Libraries with Automatic Reel Transport.- Semiconductor Memories.- Fabrication Technology and Physical Fundamentals of Components Used for Semiconductor Memories.- LSI Semiconductor Memories.- A High Performance Low Power 2048-Bit Memory Chip in MOSFET Technology and Its Application.- Readout Methods and Readout Circuits for Dynamik Charge-Storage Elements.- Monolithic Memories.- Structure, Organization and Applications of CCD Memories.- BEAMOS — Technology and Applications.- Read-Only Memories.- Read-Only Memories with Magnetic Components or with Integrated Semiconductor Circuits.- Electrically Alterable MOS-ROMs, with Particular Emphasis on the Floating Gate Type.- Magnetic Bubble Memories.- Physical Principles of Magnetic Bubble Domain Memory Devices.- Application of the Josephson Effect for Digital Storage.- Ferromagnetic Domain Memories.- Low Temperature Memories.- Application of the Josephson Effect for Digital.- Optical Memories.- Materials for Optical Data Stores.- Optical Memory Systems.- Reliability.- Effects of Defects on Yield, Integration, Cost and Reliability of Large Scale Integrated Semiconductor Memories. — A Tutorial Review.- Reliability of Semiconductor Memories from a Practical Point of View.- Application of Partially Defective Semiconductor Memory Devices in Memory Systems.- Memory / Storage Systems.- Access Methods and Associative Memories.- Increased Chip Capacity and Extended Logical Complexity of LSI-Associative Memories.- Storage Hierarchy Technology and Organization.- The Performance of Small Cache Memories inMinicomputer Systems with Several Processors.- Summary of Abstracts.- The Autors, the Editor.