Digital Noise Monitoring of Defect Origin: Lecture Notes in Electrical Engineering, cartea 2
Autor Telman Alieven Limba Engleză Paperback – 24 noi 2010
Toate formatele și edițiile | Preț | Express |
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Paperback (1) | 624.57 lei 43-57 zile | |
Springer Us – 24 noi 2010 | 624.57 lei 43-57 zile | |
Hardback (1) | 630.64 lei 43-57 zile | |
Springer Us – 25 iul 2007 | 630.64 lei 43-57 zile |
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Specificații
ISBN-13: 9781441944108
ISBN-10: 1441944109
Pagini: 236
Ilustrații: XII, 224 p.
Dimensiuni: 155 x 235 x 12 mm
Greutate: 0.34 kg
Ediția:Softcover reprint of hardcover 1st ed. 2007
Editura: Springer Us
Colecția Springer
Seria Lecture Notes in Electrical Engineering
Locul publicării:New York, NY, United States
ISBN-10: 1441944109
Pagini: 236
Ilustrații: XII, 224 p.
Dimensiuni: 155 x 235 x 12 mm
Greutate: 0.34 kg
Ediția:Softcover reprint of hardcover 1st ed. 2007
Editura: Springer Us
Colecția Springer
Seria Lecture Notes in Electrical Engineering
Locul publicării:New York, NY, United States
Public țintă
Professional/practitionerCuprins
Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features.- Position-Binary Technology of Monitoring Defect at its Origin.- Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of a Defect's Origin.- Robust Correlation Monitoring of a Defect at its Origin.- Spectral Monitoring of a Defect's Origin.- The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier.- The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier.
Recenzii
From the reviews:
“The monograph builds on a long series of publications by the author over the last decade. … monograph should benefit researchers and practicing engineers … particularly those in search of new application tools in quality engineering applied in a broad setting. … In summary this monograph is undoubtedly going to be a valuable research tool in the hands of an applied scientist, an engineer and a quality reliability engineer in industry.” (Sailes K. Sengupta, Technometrics, Vol. 53 (1), February, 2011)
“The monograph builds on a long series of publications by the author over the last decade. … monograph should benefit researchers and practicing engineers … particularly those in search of new application tools in quality engineering applied in a broad setting. … In summary this monograph is undoubtedly going to be a valuable research tool in the hands of an applied scientist, an engineer and a quality reliability engineer in industry.” (Sailes K. Sengupta, Technometrics, Vol. 53 (1), February, 2011)
Textul de pe ultima copertă
Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of the defect and its stages, and control of the defect. The significance of this work is also connected to the possibility of using the noise as a data carrier for creating technologies that detect the initial stage of changes in objects.
Caracteristici
Includes several technologies that cover the initial stage of the origin of the defect Theoretically proves the various technologies Exemplifies the applications for solving problems concerning noise monitoring at the beginning of the defect origin Includes supplementary material: sn.pub/extras