DNA Damage Recognition
Editat de Wolfram Siede, Paul W. Doetschen Limba Engleză Paperback – 18 oct 2019
about the editors...
WOLFRAM SIEDE is Associate Professor, Department of Cell Biology and Genetics, University of North Texas Health Science Center, Fort Worth. He received the Ph.D. degree (1986) from Johann Wolfgang Goethe University, Frankfurt Germany.
YOKE WAH KOW is Professor, Department of Radiation Oncology, Emory University School of Medicine, Atlanta, Georgia. He received the Ph.D. degree (1981) from Brandeis University, Waltham, Massachusetts.
PAUL W. DOETSCH is Professor, Departments of Biochemistry, Radiation Oncology, and Hematology and Oncology, and Associate Director for Basic Research, Winship Cancer Institute, Emory University School of Medicine, Atlanta, Georgia. He received the Ph.D. degree (1982) from Temple University School of Medicine, Philadelphia, Pennsylvania.
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Specificații
ISBN-13: 9780367392130
ISBN-10: 0367392135
Pagini: 896
Dimensiuni: 178 x 254 x 46 mm
Greutate: 1.66 kg
Ediția:1
Editura: CRC Press
Colecția CRC Press
ISBN-10: 0367392135
Pagini: 896
Dimensiuni: 178 x 254 x 46 mm
Greutate: 1.66 kg
Ediția:1
Editura: CRC Press
Colecția CRC Press
Public țintă
Academic and Professional Practice & DevelopmentCuprins
Mechanisms of Damage Recognition: Theoretical Considerations. UV Damage and Other Bulky DNA-adducts. Non-bulky Base Damage. Mismatch Repair. Replicational Bypass of DNA Lesions. DNA Strand Breaks. Perception of DNA Damage for Initiating Regulatory Responses
Notă biografică
Wolfram Siede, Yoke Wah Kow, Paul W. Doetsch
Descriere
Covering an array of topics, this authoritative work summarizes recent developments, while providing timely reviews on the molecular mechanisms employed by cells to distinguish between damaged and undamaged sites and stimulate the appropriate repair pathways. Richly illustrated, this guide discusses the theoretical aspects of DNA damage recognition, exploring those that are relevant for various regulatory responses, such as transcriptional regulation or checkpoint arrest. It also details key concepts in the recognition of bulky DNA base damage, reviews the excision repair of non-bulky base damage, covers short-patch repair and the recognition and repair of single- and double-strand breaks.