Electron Microbeam Analysis: Mikrochimica Acta Supplementa, cartea 12
Editat de Abraham Boekestein, Miodrag K. Pavicevicen Limba Engleză Paperback – 31 iul 1992
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Specificații
ISBN-13: 9783211823590
ISBN-10: 321182359X
Pagini: 292
Ilustrații: IX, 278 p. 35 illus.
Dimensiuni: 210 x 280 x 15 mm
Greutate: 0.68 kg
Ediția:Softcover reprint of the original 1st ed. 1992
Editura: SPRINGER VIENNA
Colecția Springer
Seria Mikrochimica Acta Supplementa
Locul publicării:Vienna, Austria
ISBN-10: 321182359X
Pagini: 292
Ilustrații: IX, 278 p. 35 illus.
Dimensiuni: 210 x 280 x 15 mm
Greutate: 0.68 kg
Ediția:Softcover reprint of the original 1st ed. 1992
Editura: SPRINGER VIENNA
Colecția Springer
Seria Mikrochimica Acta Supplementa
Locul publicării:Vienna, Austria
Public țintă
ResearchCuprins
EPMA - A Versatile Technique for the Characterization of Thin Films and Layered Structures..- Quantitative EPMA of the Ultra-Light Elements Boron Through Oxygen..- Auger Microscopy and Electron Probe Microanalysis..- Quantitative X-Ray Microanalysis of Ultra-Thin Resin-Embedded Biological Samples..- Analytical and High-Resolution Electron Microscopy Studies at Metal/Ceramic Interfaces..- Quantitative Electron Probe Microanalysis of Multi-layer Structures..- Comparison of ? (?z) Curve Models in EPMA..- Quantitative Electron Probe Microanalysis: New Accurate ? (?z) Description..- A Modular Universal Correction Procedure for Quantitative EPMA..- Monte Carlo Simulation of Backscattered and Secondary Electron Profiles..- An Electron Scattering Model Applied to the Determination of Film Thicknesses Using Electron Probe Microanalysis..- Calculation of Depth Distribution Functions for Characteristic and for Continuous Radiation..- A Method for In-Situ Calibration of Semiconductor Detectors..- Background Anomalies in Electron Probe Microanalysis Caused by Total Reflection..- Automatic Analysis of Soft X-Ray Emission Spectra Obtained by EPMA..- The Scanning Very-Low-Energy Electron Microscopy (SVLEEM)..- To the Backscattering Contrast in Scanning Auger Microscopy..- Design Consideration Regarding the Use of an Accelerator on Mass Spectrometer in Ion Microanalysis..- Accurate Estimation of Uncertainties in Quantitative Electron Energy- Loss Spectrometry..- An EELS System for a TEM/STEM-Performance and Its Use in Materials Science..- Quantitative X-Ray Microanalysis of Bio-Organic Bulk Specimens..- Quantitative Analysis of (Y2O3)x (ZrO2)1-x Films on Silicon by EPMA..- EPMA of Surface Oxide Films..- Non-Destructive Determination of Ion-Implanted Impurity Distribution in Siliconby EPMA..- An Electron Spectroscopy Study of a-SiNx Films..- Electron Probe Microanalysis of Glass Fiber Optics..- Quantitative Microanalysis of Low Concentrations of Carbon In Steels..- Electron Configuration of the Valence-Conduction Band of the Mineral Wustite..- Structural Analysis of Silver Halide Cubic Microcrystals with Epitaxial or Conversion Growths by STEM-EDX..- Characterization of the Bony Matrix of the Otic Capsule in Human Fetuses by EPMA..- Overview..