EMC 2008: Vol 1: Instrumentation and Methods
Editat de Martina Luysberg, Karsten Tillmann, Thomas Weirichen Limba Engleză Hardback – 26 aug 2008
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Specificații
ISBN-13: 9783540851547
ISBN-10: 3540851542
Pagini: 904
Ilustrații: XXXVIII, 862 p.
Dimensiuni: 155 x 235 x 53 mm
Greutate: 1.38 kg
Ediția:2008
Editura: Springer Berlin, Heidelberg
Colecția Springer
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 3540851542
Pagini: 904
Ilustrații: XXXVIII, 862 p.
Dimensiuni: 155 x 235 x 53 mm
Greutate: 1.38 kg
Ediția:2008
Editura: Springer Berlin, Heidelberg
Colecția Springer
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchCuprins
Instrumentation and Methods.- TEM and STEM instrumentation and Electron Optics.- TEM and STEM methods.- SEM/FIB Instrumentation and Methods.- Other Microscopies.- Image analysis and Processing.- Sample Preparation for Materials Science and Biology.
Textul de pe ultima copertă
Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008.
Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world.
The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.
Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world.
The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.