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ESSDERC ’89: 19th European Solid State Device Research Conference, Berlin

Editat de Anton Heuberger, Heiner Ryssel, Peter Lange
en Limba Engleză Paperback – iul 2012
The conference ESSDERC '89 held in September 1989 in Berlin was concerned with the physics, electrical characteristics, reliability and processing of solid state devices and electronic materials. The proceedings contain all invited and contributed papers of the conference and thus becomes a state-of-the-art-report of solid state device research in Europe 1989.
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Specificații

ISBN-13: 9783642523168
ISBN-10: 3642523161
Pagini: 996
Ilustrații: XXV, 963 p. 264 illus.
Dimensiuni: 155 x 235 x 52 mm
Greutate: 1.37 kg
Ediția:Softcover reprint of the original 1st ed. 1989
Editura: Springer Berlin, Heidelberg
Colecția Springer
Locul publicării:Berlin, Heidelberg, Germany

Public țintă

Research

Cuprins

From the Contents: Silicon and Compound Semiconductor Devices: MOS and Bipolar Structures.- New Devices, Submicron Devices.- III-V and II-VI Devices.- Quantum Well Devices and Heterostructures.- Lasers and Photodetectors.- Integrated Optoelectronics.- Sensors.- Cryogenic Devices.- Device Modelling.- Device Characterization.- Radiation Damage, Radiation Hardening.- Superconductivity in Semiconductor Devices.- Silicon and Compound Semiconductor Technology: Technology on III-V and II-VI Compounds.- Epitaxy Processes (LPE, MBE, MO-CVD,...).- Deposition Processes.- Plasma Processes.- Rapid Thermal Annealing.- Submicron Lithography.- Passivation.- Non-destructive Testing of Wafers, Layers, Devices.- Reliability and Defects.- Process Modelling.