Handbook of Photomask Manufacturing Technology
Editat de Syed Rizvien Limba Engleză Hardback – 7 apr 2005
The Handbook of Photomask Manufacturing Technology features contributions from 40 internationally prominent authors from industry, academia, government, national labs, and consortia. These authors discuss conventional masks and their supporting technologies, as well as next-generation, non-optical technologies such as extreme ultraviolet, electron projection, ion projection, and x-ray lithography. The book begins with an overview of the history of photomask development. It then demonstrates the steps involved in designing, producing, testing, inspecting, and repairing photomasks, following the sequences observed in actual production. The text also includes sections on materials used as well as modeling and simulation.
Continued refinements in the photomask-making process have ushered in the sub-wavelength era in nanolithography. This invaluable handbook synthesizes these refinements and provides the tools and possibilities necessary to reach the next generation of microfabrication technologies.
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Specificații
ISBN-13: 9780824753740
ISBN-10: 0824753747
Pagini: 728
Ilustrații: 384 b/w images, 43 tables, 128 halftones and 142 equations
Dimensiuni: 178 x 254 x 39 mm
Greutate: 1.51 kg
Ediția:New.
Editura: CRC Press
Colecția CRC Press
ISBN-10: 0824753747
Pagini: 728
Ilustrații: 384 b/w images, 43 tables, 128 halftones and 142 equations
Dimensiuni: 178 x 254 x 39 mm
Greutate: 1.51 kg
Ediția:New.
Editura: CRC Press
Colecția CRC Press
Public țintă
ProfessionalCuprins
Introduction. Introduction to Mask Making. Mask Writing. Data Preparation. Mask Writers: An Overview. E-Beam Mask Writers. Laser Mask Writers. Optical Masks. Optical masks: An Overview. Conventional Optical Masks. Advanced Optical Masks. NGL Masks. NGL Masks: An Overview. Masks for Electron Beam Projection Lithography. Masks for Extreme Ultraviolet Lithography. Masks for Ion Projection Lithography. Mask for Proximity X-Ray Lithography. Mask Processing, Materials, and Pellicles. Mask Substrate. Resists for Mask Making. Resist Charging and Heating. Mask Processing. Mask Materials: Optical Properties. Pellicles. Mask Metrology, Inspection, Evaluation, and Repairs. Photomask Feature Metrology. Optical Critical Dimension Metrology. Photomask Critical Dimension Metrology in the Scanning Electron Microscope. Geometrical Characterization of Mask Using SPM. Metrology of Image Placement. Optical Thin Film Metrology for Photomask Applications. Phase Measurement Tool for PSM. Mask Inspection: Theories and Principle. Tool for Inspecting Masks: Lasertec MD 2500. Tool for Mask Image Evaluation. Mask Repairs. Modeling and Simulation. Modeling and Simulation. Index.
Recenzii
". . . a stellar addition to this field . . . a must-have for every mask maker’s library . . . there is too much in this book that is absolutely fantastic."
– Dan Hutcheson, in Paper Details, March 2007
– Dan Hutcheson, in Paper Details, March 2007
Descriere
As the semiconductor industry attempts to increase the number of functions that will fit into the smallest space on a chip, it is increasingly important for new technologies to keep pace with these demands. Photomask technology is one of the key areas to achieving this goal. This valuable reference provides a comprehensive summary of all areas of mask technology in a single work, featuring contributions from 40 internationally reputable authors from industry, academia, government, national labs, and consortia. They discuss conventional masks and their supporting technologies, as well as next-generation technologies such as extreme ultraviolet, electron projection, ion projection, and X-ray lithography.