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High-Resolution Transmission Electron Microscopy and Associated Techniques

Editat de Peter R. Buseck, John M. Cowley, Leroy Eyring
en Limba Engleză Hardback – 12 iul 1989
This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. It delineates the theory of elastic scattering, which is most useful for spectroscopies and chemical analyses. There are also discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, solid state chemistry, minerology, semiconductors, and metals. Contributors include: J. Cowley, J. Spence, P. Buseck, P. Self, and M.A. O'Keefe. Compiled by experts in the fields of geology, physics and chemistry, this comprehensive text will be the standard reference for years to come.
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Specificații

ISBN-13: 9780195042757
ISBN-10: 0195042751
Pagini: 670
Ilustrații: numerous illustrations, diagrams and tables
Dimensiuni: 162 x 245 x 45 mm
Greutate: 1.08 kg
Editura: OUP OXFORD
Colecția OUP Oxford
Locul publicării:Oxford, United States

Cuprins

Imaging; Imaging theory; Elastic scattering of electrons by crystals; Elastic scattering theory; Inelastic electron scattering; Inelastic scattering II; Techniques closely related to high resolution electron microscopy; Calculation of diffraction patterns and images for Fasr electrons; Mineralogy; Contributions of high resolution electron microscopy studies to solid state chemistry; Materials science: metals, ceramics, and semiconductors; Practical high resolution electron microscopy; Surfaces; Highly disordered materials

Recenzii

'This book is a must for every microscopist who uses high-resolution transmission electron microscopy. ...it is a book which will stand the test of time without any difficulty whatsoever.' Journal of Microscopy