High-Resolution Transmission Electron Microscopy and Associated Techniques
Editat de Peter R. Buseck, John M. Cowley, Leroy Eyringen Limba Engleză Hardback – 13 iul 1989
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Specificații
ISBN-13: 9780195042757
ISBN-10: 0195042751
Pagini: 670
Ilustrații: numerous illustrations, diagrams and tables
Dimensiuni: 162 x 245 x 45 mm
Greutate: 1.5 kg
Editura: OUP OXFORD
Colecția OUP Oxford
Locul publicării:Oxford, United States
ISBN-10: 0195042751
Pagini: 670
Ilustrații: numerous illustrations, diagrams and tables
Dimensiuni: 162 x 245 x 45 mm
Greutate: 1.5 kg
Editura: OUP OXFORD
Colecția OUP Oxford
Locul publicării:Oxford, United States
Cuprins
Imaging; Imaging theory; Elastic scattering of electrons by crystals; Elastic scattering theory; Inelastic electron scattering; Inelastic scattering II; Techniques closely related to high resolution electron microscopy; Calculation of diffraction patterns and images for Fasr electrons; Mineralogy; Contributions of high resolution electron microscopy studies to solid state chemistry; Materials science: metals, ceramics, and semiconductors; Practical high resolution electron microscopy; Surfaces; Highly disordered materials
Recenzii
'This book is a must for every microscopist who uses high-resolution transmission electron microscopy. ...it is a book which will stand the test of time without any difficulty whatsoever.' Journal of Microscopy