Innovative Technological Materials: Structural Properties by Neutron Scattering, Synchrotron Radiation and Modeling
Editat de Jacek J. Skrzypek, Franco Rustichellien Limba Engleză Hardback – 6 mai 2010
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Specificații
ISBN-13: 9783642120589
ISBN-10: 364212058X
Pagini: 200
Ilustrații: XXII, 279 p.
Dimensiuni: 155 x 235 x 23 mm
Greutate: 0.6 kg
Ediția:2010
Editura: Springer Berlin, Heidelberg
Colecția Springer
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 364212058X
Pagini: 200
Ilustrații: XXII, 279 p.
Dimensiuni: 155 x 235 x 23 mm
Greutate: 0.6 kg
Ediția:2010
Editura: Springer Berlin, Heidelberg
Colecția Springer
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchCuprins
and State-of-the-Art.- X-ray and Neutron Scattering.- Microstructural Investigations by Small Angle Scattering of Neutrons and X-rays.- Residual Stress Analysis by Neutron and X-ray Diffraction.- Three-Dimensional Imaging by Microtomography of X-ray Synchrotron Radiation and Neutrons.- Constitutive Models for Analysis and Design of Multifunctional Technological Materials.- Enhanced Numerical Tools for Computer Simulation of Coupled Physical Phenomena and Design of Components Made of Innovative Materials.
Textul de pe ultima copertă
This book provides at first ideas on the answers that neutrons and Synchrotron Radiation could give in innovative materials science and technology. In particular, non-conventional, unusual or innovative neutron and x-ray scattering experiments (from both the scientific and the instrumental point of view) will be described which either have novel applications or provide a new insight into material science and technology. Moreover, a capability of the existing and the enhanced constitutive models and numerical procedures to predict complex behaviour of the novel multifunctional materials is examined.
Caracteristici
Provides a new insight into material science and technology Examines constitutive models and numerical procedures to predict complex behaviour of the novel multifunctional materials Includes an introduction into Microtomography Includes supplementary material: sn.pub/extras