Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping
Autor Olaf Engler, Stefan Zaefferer, Valerie Randleen Limba Engleză Paperback – 27 feb 2024
- Discusses terminology associated with orientations, texture, and their representation, as well as the diffraction of radiation, a phenomenon that is the basis for almost all texture analysis
- Covers data acquisition, as well as representation and evaluation related to the well-established methods of macrotexture analysis
- Updated to include experimental details of the latest transmission or scanning electron microscope-based techniques for microstructure analysis, including electron backscatter diffraction (EBSD)
- Describes how microtexture data are evaluated and represented and emphasizes the advances in orientation microscopy and mapping, and advanced issues concerning crystallographic aspects of interfaces and connectivity
- Offers new and innovative grain boundary descriptions and examples
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Specificații
ISBN-13: 9781032189420
ISBN-10: 1032189428
Pagini: 580
Ilustrații: 3 Line drawings, color; 146 Line drawings, black and white; 35 Halftones, color; 99 Halftones, black and white; 38 Illustrations, color; 245 Illustrations, black and white
Dimensiuni: 156 x 234 x 29 mm
Greutate: 0.96 kg
Ediția:3 ed
Editura: CRC Press
Colecția CRC Press
ISBN-10: 1032189428
Pagini: 580
Ilustrații: 3 Line drawings, color; 146 Line drawings, black and white; 35 Halftones, color; 99 Halftones, black and white; 38 Illustrations, color; 245 Illustrations, black and white
Dimensiuni: 156 x 234 x 29 mm
Greutate: 0.96 kg
Ediția:3 ed
Editura: CRC Press
Colecția CRC Press
Public țintă
Postgraduate and ProfessionalCuprins
Part I: Fundamental Issues. 1. Introduction. 2. Descriptors of Orientation. 3. Application of Diffraction to Texture Analysis. Part II: Macrotexture Analysis. 4. Macrotexture Measurements. 5. Evaluation and Representation of Macrotexture Data. Part III: Microtexture Analysis. 6. Diffraction Techniques in TEM and SEM. 7. Procedures for Orientation Determination from Electron Diffraction Patterns. 8. Practice of Orientation Measurement and Orientation Microscopy. 9. Orientation Microscopy and Orientation Mapping. 10. Evaluation and Representation of Microtexture Data. 11. Crystallographic Analysis of Interfaces, Surfaces, and Connectivity. 12. Orientation Relationships between Phases and Texture Formation during Phase Transformations. 13. Synchrotron Radiation, Nondiffraction Techniques, and Comparisons between Methods. Appendices.
Notă biografică
Olaf Engler is senior scientist of metallurgy at the Research and Development Center of Hydro Aluminium in Bonn, Germany. Prior to that, he was at the University of Technology in Aachen, Germany, and the Materials Science and Technology Division of Los Alamos National Laboratory in the United States. Since 2004, he has also been an adjunct professor for Texture and Crystal Plasticity at the NTNU Trondheim, Norway, and a member of the international committee of the International Conference on Texture of Materials (ICOTOM). Engler has more than 20 years of experience in analysis, interpretation, and modeling of the development of microstructure and texture during the thermomechanical processing of metallic materials and control of the resulting materials properties.
Stefan Zaefferer is Group Leader, Microscopy and Diffraction, Max-Planck-Institut für Eisenforschung GmbH.
Stefan Zaefferer is Group Leader, Microscopy and Diffraction, Max-Planck-Institut für Eisenforschung GmbH.
Descriere
Reflecting emerging methods and the evolution of the field, Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation keeps mathematics to a minimum in covering both traditional macrotexture analysis and more advanced electron-microscopy-based microtexture analysis.