Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects
Autor Jean- Paul Mornirolien Limba Engleză Paperback – noi 2004
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Specificații
ISBN-13: 9782901483052
ISBN-10: 2901483054
Pagini: 450
Dimensiuni: 156 x 234 x 23 mm
Greutate: 0.61 kg
Ediția:1
Editura: CRC Press
Colecția CRC Press
ISBN-10: 2901483054
Pagini: 450
Dimensiuni: 156 x 234 x 23 mm
Greutate: 0.61 kg
Ediția:1
Editura: CRC Press
Colecția CRC Press
Public țintă
ProfessionalRecenzii
"… an excellent book … a rare example of a pedagogically sound text … will provide a superb teaching text for courses on electron diffraction around the world. Every TEM materials lab should have one."
-Professor John Spence, Arizona State University, Tempe, USA
-Professor John Spence, Arizona State University, Tempe, USA
Cuprins
Introduction I - Bragg's law II - Formation of the diffraction pattern in the electron microscope III- Electron diffraction patterns produced by a parallel incident beam IV- Diffraction pattern produced by a convergent incident beam: CBED pattern V - Diffraction pattern produced by a large-angle convergent incident beam: Kossel pattern VI - Diffraction pattern produced by a large-angle convergent beam: LACBED Patterns VII- Diffracted and transmitted intensities XI - Characterization of crystal defects from LACBED patterns VIII- Experimental methods IX- LACBED variants X - Indexing LACBED patterns Conclusion
Notă biografică
The author Jean- Paul Morniroli is a professor in the Ecole Nationale Superieure de Chimie of Lille: his research is performed in the Laboratoire de Metallurgie et Genie des Materiaux CNRS 8517 of the Universite des Sciences at Technologies de Lille. He is a specialist in electron diffraction. The translator Etienne Bres is a Professor in the Universite des Sciences at Technologies de Lille, He is a specialist in the nanoscale characterization of biological and synthetic nanomaterials.
Descriere
This book is devoted to convergent-beam diffraction-a method capable of providing remarkably accurate crystallographic information. The description of convergent-beam electron diffraction and especially of LACBED is preceded by several preparatory chapters, in which the principles of diffraction and the nature of electron-matter interactions are clearly set out. An entire chapter is concerned with instrumentation. Another on the interpretation of diffraction patterns enables the reader to master all stages in the process. The book ends with a long chapter in which numerous applications concerned with the characterization of crystal defects are examined and analyzed.