Lifetime Reliability-aware Design of Integrated Circuits
Autor Mohsen Raji, Behnam Ghavamien Limba Engleză Paperback – 18 noi 2023
| Toate formatele și edițiile | Preț | Express |
|---|---|---|
| Paperback (1) | 565.92 lei 6-8 săpt. | |
| Springer International Publishing – 18 noi 2023 | 565.92 lei 6-8 săpt. | |
| Hardback (1) | 571.86 lei 6-8 săpt. | |
| Springer International Publishing – 17 noi 2022 | 571.86 lei 6-8 săpt. |
Preț: 565.92 lei
Preț vechi: 665.78 lei
-15% Nou
Puncte Express: 849
Preț estimativ în valută:
108.34€ • 112.61$ • 89.83£
108.34€ • 112.61$ • 89.83£
Carte tipărită la comandă
Livrare economică 08-22 februarie 25
Preluare comenzi: 021 569.72.76
Specificații
ISBN-13: 9783031153471
ISBN-10: 3031153472
Pagini: 107
Ilustrații: XIII, 107 p. 31 illus., 13 illus. in color.
Dimensiuni: 155 x 235 mm
Greutate: 0.19 kg
Ediția:1st ed. 2023
Editura: Springer International Publishing
Colecția Springer
Locul publicării:Cham, Switzerland
ISBN-10: 3031153472
Pagini: 107
Ilustrații: XIII, 107 p. 31 illus., 13 illus. in color.
Dimensiuni: 155 x 235 mm
Greutate: 0.19 kg
Ediția:1st ed. 2023
Editura: Springer International Publishing
Colecția Springer
Locul publicării:Cham, Switzerland
Cuprins
1. Impacts of Process Variations and Aging on Lifetime Reliability of Flip-Flops.- 2 Restructuring-based Lifetime Reliability Improvement of Nano-scale Master-Slave Flip-Flops.- 3 Lifetime Reliability Improvement of Pulsed Flip-Flops.- 4 Gate Sizing-based Lifetime Reliability Improvement of Integrated Circuits.- 5 Joint Timing Yield and Lifetime Reliability Optimization of Integrated Circuits.- 6 Lifetime Reliability Optimization Algorithms of Integrated Circuits using Dual Threshold Voltage Assignment.
Notă biografică
Mohsen Raji received his Ph.D. degree in computer engineering from Amirkabir University of Technology, Tehran, Iran. He has been serving as a faculty member in School of Electrical and Computer Engineering, Shiraz University, Shiraz, Iran, since 2015. He teaches courses such as VLSI systems design, microprocessors, embedded systems, fault tolerant system design. He has supervised or co-supervised about 10 graduate students and published over 30 refereed papers. He is serving as an associated editor of Iranian Journal of Science and Technology, Transactions of Electrical Engineering. His current research interests include dependable computing, reliable and robust logic designs, design automation of digital systems, and embedded systems.
Behnam Ghavami was born in Esfarayen, Iran. He received his Ph.D. degree in computer engineering from Amirkabir University of Technology, Tehran, Iran. He has been serving as a Faculty Member with the Computer Engineering Department, Shahid Bahonar University of Kerman, since 2010, where he is currently an Associate Professor. He teaches courses in design and test of digital systems, computer architecture, embedded processor design, and reliable circuit design. He has supervised or co-supervised about 20 graduate students. He has published over 100 refereed papers. His research interests include the design automation of digital systems, computer architecture, statistical analysis, robust logic designs, and embedded processors. He is currently an Associate Editor of the Journal of Electronic Testing-Springer and Microelectronics Journal-Elsevier. He has a decade of industry experience, including working on FPGA in automotive industry.
Behnam Ghavami was born in Esfarayen, Iran. He received his Ph.D. degree in computer engineering from Amirkabir University of Technology, Tehran, Iran. He has been serving as a Faculty Member with the Computer Engineering Department, Shahid Bahonar University of Kerman, since 2010, where he is currently an Associate Professor. He teaches courses in design and test of digital systems, computer architecture, embedded processor design, and reliable circuit design. He has supervised or co-supervised about 20 graduate students. He has published over 100 refereed papers. His research interests include the design automation of digital systems, computer architecture, statistical analysis, robust logic designs, and embedded processors. He is currently an Associate Editor of the Journal of Electronic Testing-Springer and Microelectronics Journal-Elsevier. He has a decade of industry experience, including working on FPGA in automotive industry.
Textul de pe ultima copertă
This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.
- Provides an easy-to-follow procedure for analyzing lifetime reliability of nano-scale digital circuits;
- Describes state-of-the artaging- and process variation-aware CAD algorithms;
- Includes reliability improvement techniques for common clocked storage element.
Caracteristici
Provides an easy-to-follow procedure for analyzing lifetime reliability of nano-scale digital circuits Describes state-of-the art aging- and process variation-aware CAD algorithms Includes reliability improvement techniques for common clocked storage element