Cantitate/Preț
Produs

Magnetic Memory: Fundamentals and Technology

Autor Denny D. Tang, Yuan-Jen Lee
en Limba Engleză Hardback – 21 apr 2010
If you are a semiconductor engineer or a magnetics physicist developing magnetic memory, get the information you need with this, the first book on magnetic memory. From magnetics to the engineering design of memory, this practical book explains key magnetic properties and how they are related to memory performance, characterization methods of magnetic films, and tunneling magnetoresistance effect devices. It also covers memory cell options, array architecture, circuit models, and read-write engineering issues. You'll understand the soft fail nature of magnetic memory, which is very different from that of semiconductor memory, as well as methods to deal with the issue. You'll also get invaluable problem-solving insights from real-world memory case studies. This is an essential book for semiconductor engineers who need to understand magnetics, and for magnetics physicists who work with MRAM. It is also a valuable reference for graduate students working in electronic/magnetic device research.
Citește tot Restrânge

Preț: 101543 lei

Preț vechi: 118074 lei
-14% Nou

Puncte Express: 1523

Preț estimativ în valută:
19434 20502$ 16195£

Carte tipărită la comandă

Livrare economică 02-16 ianuarie 25

Preluare comenzi: 021 569.72.76

Specificații

ISBN-13: 9780521449649
ISBN-10: 0521449642
Pagini: 208
Ilustrații: 150 b/w illus. 5 tables 15 exercises
Dimensiuni: 180 x 254 x 15 mm
Greutate: 0.57 kg
Editura: Cambridge University Press
Colecția Cambridge University Press
Locul publicării:Cambridge, United Kingdom

Cuprins

1. Basic magnetostatics; 2. Magnetic films; 3. Properties of patterned ferromagnetic film; 4. Magnetoresistance effects and memory devices; 5. Field-write mode MRAMs; 6. Spin torque transfer MRAM; 7. Applications of MTJ based technology; Appendices: A. Unit conversion table cgs vs. SI; B. Dimensions of magnetism; C. Physical constants; D. Normal (Gaussian) distribution and quantile plot; E. Weibull distribution; F. TDDB reliability test of thin film; G. Binomial distribution and Poisson distribution; H. Defect density; I. Fe, Co, Ni element chemistry parameters; J. Soft error, hard fail and design margin.

Notă biografică


Descriere

If you are involved in developing magnetic memory, get the information and problem-solving insights you need with this practical guide.