Cantitate/Preț
Produs

Microstructural Characterisation Techniques: Indian Institute of Metals Series

Autor Gunturi Venkata Sitarama Sastry
en Limba Engleză Hardback – 15 sep 2022
This textbook is aimed at graduate and upper undergraduate students studying materials science and metallurgy. It comprehensively covers the topic of microstructural characterization and includes an emphasis on Fourier analysis and Fourier transformation, electron diffraction, electromagnetic waves and electron waves, lens parameters, transmission electron microscopy, optical microscopy and scanning electron microscopy. The author has included pedagogical features such as end-of-chapter exercises and worked examples with varying degrees of difficulty to augment learning and self-testing. This book will be a useful guide for upper undergraduate and graduate students along with researchers and professionals working in the field of microstructural characterization.
Citește tot Restrânge

Toate formatele și edițiile

Toate formatele și edițiile Preț Express
Paperback (1) 37846 lei  6-8 săpt.
  Springer Nature Singapore – 17 sep 2023 37846 lei  6-8 săpt.
Hardback (1) 38561 lei  3-5 săpt.
  Springer Nature Singapore – 15 sep 2022 38561 lei  3-5 săpt.

Din seria Indian Institute of Metals Series

Preț: 38561 lei

Nou

Puncte Express: 578

Preț estimativ în valută:
7381 7748$ 6097£

Carte disponibilă

Livrare economică 09-23 ianuarie 25

Preluare comenzi: 021 569.72.76

Specificații

ISBN-13: 9789811935084
ISBN-10: 9811935084
Ilustrații: XIX, 242 p. 209 illus., 60 illus. in color.
Dimensiuni: 155 x 235 mm
Greutate: 0.54 kg
Ediția:1st ed. 2022
Editura: Springer Nature Singapore
Colecția Springer
Seria Indian Institute of Metals Series

Locul publicării:Singapore, Singapore

Cuprins

Introduction.- Electromagnetic Waves and Electron Waves.- Fourier Analysis and Fourier Transformation.- Transmission Electron Microscope.- Electron Diffraction.- Optical Microscopy.- Transmission Electron Microscopy.- Lens-less Electron Microscopy

Notă biografică

Prof. Gunturi Venkata Sitarama Sastry is former Professor, Department of Metallurgical Engineering and also Dean of Academic Affairs, IIT(BHU), Varanasi, India for a three year period. He began extensive use of transmission electron microscopy since his doctoral work on rapidly quenched aluminum alloys at IT-BHU, Varanasi. His research tools have been diverse microstructural characterization techniques with major emphasis on TEM. Most of his publications in high impact international Journals reflect this vast expertise in the field. Several of his students benefited from his courses on metallographic techniques taught at the Department of Metallurgical Engineering, IIT(BHU), Varanasi, India (formerly Institute of Technology, BHU). He also conducted many short-term courses on electron microscopy and associated techniques at various institutions and research laboratories. He headed the National Electron Microscopy Facility established at the Department for over five years and later worked for the augmentation of new facilities over there. The Electron Microscope Society of India recognized his contributions to the field by bestowing upon him the ‘Lifetime Achievement Award 2017’.

Textul de pe ultima copertă

This textbook is aimed at graduate and upper undergraduate students studying materials science and metallurgy. It comprehensively covers the topic of microstructural characterization and includes an emphasis on Fourier analysis and Fourier transformation, electron diffraction, electromagnetic waves and electron waves, lens parameters, transmission electron microscopy, optical microscopy and scanning electron microscopy. The author has included pedagogical features such as end-of-chapter exercises and worked examples with varying degrees of difficulty to augment learning and self-testing. This book will be a useful guide for upper undergraduate and graduate students along with researchers and professionals working in the field of microstructural characterization.

Caracteristici

Discusses Fourier analysis and Fourier transformation, electron diffraction, and electromagnetic waves
Includes pedagogical features such as end-of-chapter exercises and worked examples
Is useful guide for upper undergraduate and graduate students studying microstructural characterization