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Novel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials de Y. Waseda

Novel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials: Lecture Notes in Physics, cartea 204

Autor Y. Waseda
en Limba Engleză Paperback – iul 1984

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Specificații

ISBN-13: 9783540133599
ISBN-10: 3540133593
Pagini: 196
Ilustrații: VI, 186 p.
Dimensiuni: 155 x 235 x 10 mm
Greutate: 0.28 kg
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Lecture Notes in Physics

Locul publicării:Berlin, Heidelberg, Germany

Public țintă

Research

Cuprins

A brief background of the present requirement for structural characterization of disordered materials.- Fundamental relationships between rdf and scattering intensity.- Definition of partial structure factors and compositional short range order (CSRO).- Experimental determination of partial structural functions.- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials.- Theoretical aspects on the anomalous dispersion factors of x-rays.- Experimental determination of the anomalous dispersion factors.- Selected examples of structural determination using anomalous (resonance) x-ray scattering.- Relative merits of anomalous x-ray scattering and its future prospects.