Operational Amplifier Speed and Accuracy Improvement: Analog Circuit Design with Structural Methodology: The Springer International Series in Engineering and Computer Science, cartea 763
Autor Vadim V. Ivanov, Igor M. Filanovskyen Limba Engleză Hardback – 31 mar 2004
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Paperback (1) | 995.02 lei 6-8 săpt. | |
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Hardback (1) | 1002.61 lei 6-8 săpt. | |
Springer Us – 31 mar 2004 | 1002.61 lei 6-8 săpt. |
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Specificații
ISBN-13: 9781402077722
ISBN-10: 1402077726
Pagini: 208
Ilustrații: XIV, 194 p.
Dimensiuni: 155 x 235 x 17 mm
Greutate: 0.52 kg
Ediția:2004
Editura: Springer Us
Colecția Springer
Seria The Springer International Series in Engineering and Computer Science
Locul publicării:New York, NY, United States
ISBN-10: 1402077726
Pagini: 208
Ilustrații: XIV, 194 p.
Dimensiuni: 155 x 235 x 17 mm
Greutate: 0.52 kg
Ediția:2004
Editura: Springer Us
Colecția Springer
Seria The Springer International Series in Engineering and Computer Science
Locul publicării:New York, NY, United States
Public țintă
ResearchCuprins
Structural Design Methodology.- Biasing.- OpAmp Gain Structure, Frequency Compensation and Stability.- Input Stage.- Intermediate Amplification Stages.- Class AB Output Stage.- Special Functions.- From Structure to Circuit.
Recenzii
From the reviews:
"This book introduces new concepts and methodologies employed in the field of analog IC design. … The book is well written and the style throughout is readable. … The book can also be used as a textbook for graduate-level courses in Electronic Engineering, and as a reference book for engineers, scientists, and researchers active in the field … . it is an excellent work and should by read by many of us. I highly recommend this book." (Mile Stojcev, Microelectronics Reliability, Vol. 45, 2005)
"This book introduces new concepts and methodologies employed in the field of analog IC design. … The book is well written and the style throughout is readable. … The book can also be used as a textbook for graduate-level courses in Electronic Engineering, and as a reference book for engineers, scientists, and researchers active in the field … . it is an excellent work and should by read by many of us. I highly recommend this book." (Mile Stojcev, Microelectronics Reliability, Vol. 45, 2005)