Physical Properties of Amorphous Materials: Institute for Amorphous Studies Series
Editat de David Adler, Brian B. Schwartz, Martin C. Steeleen Limba Engleză Hardback – 30 apr 1985
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Specificații
ISBN-13: 9780306419072
ISBN-10: 0306419076
Pagini: 444
Ilustrații: XIV, 444 p.
Dimensiuni: 178 x 254 x 25 mm
Greutate: 1.01 kg
Ediția:1985
Editura: Springer Us
Colecția Springer
Seria Institute for Amorphous Studies Series
Locul publicării:New York, NY, United States
ISBN-10: 0306419076
Pagini: 444
Ilustrații: XIV, 444 p.
Dimensiuni: 178 x 254 x 25 mm
Greutate: 1.01 kg
Ediția:1985
Editura: Springer Us
Colecția Springer
Seria Institute for Amorphous Studies Series
Locul publicării:New York, NY, United States
Public țintă
ResearchCuprins
One: General Properties.- Chemistry and Physics of Covalent Amorphous Semiconductors.- Fundamentals of Amorphous Materials.- Two: Structure.- The Constraint of Discord.- Structural Studies of Amorphous Materials.- EXAFS of Disordered Systems.- Mössbauer Spectroscopy — A Rewarding Probe of Morphological Structure of Semiconducting Glasses.- Dislocation Mediated Pseudo-Melting at Silicon-Metal Interfaces.- Three: Phonons.- Vibrational Properties of Amorphous Solids.- Four: Electronic Structure.- Density of States in Noncrystalline Solids.- Problems Relating to the Electronic Structure of Amorphous Semiconductors.- Five: Nonequilibrium Effects.- Nonequilibrium Transport Processes in Amorphous and Other Low Conductivity Materials.- The Peculiar Motion of Electrons in Amorphous Semiconductors.- Geminate Recombination and Injection Currents: Diagnostics for Extended State Mobility.- Light-Induced Effects in Hydrogenated Amorphous Silicon Alloys.