Point Defects in Solids: Volume 2 Semiconductors and Molecular Crystals
Autor James H. Crawford, Lawrence M. Slifkinen Limba Engleză Paperback – 12 dec 2012
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Specificații
ISBN-13: 9781468409062
ISBN-10: 1468409069
Pagini: 500
Ilustrații: XVI, 480 p. 25 illus.
Dimensiuni: 152 x 229 x 26 mm
Greutate: 0.66 kg
Ediția:Softcover reprint of the original 1st ed. 1975
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
ISBN-10: 1468409069
Pagini: 500
Ilustrații: XVI, 480 p. 25 illus.
Dimensiuni: 152 x 229 x 26 mm
Greutate: 0.66 kg
Ediția:Softcover reprint of the original 1st ed. 1975
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
Public țintă
ResearchCuprins
1. Defect Creation in Semiconductors.- 1. Introduction.- 2. Defect Properties.- 3. Damage Phenomenology.- 4. Interactions of Particles with Semiconductors.- 5. Survey of Displacement Damage Results.- 6. Subthreshold and Ionization Damage.- 7. Theories of Displacement Damage Production.- 8. Summary.- References.- 2. Diffusion in Semiconductors.- 1. Introduction.- 2. Atomic Theory of Diffusion.- 3. Continuum Theory of Diffusion.- 4. Diffusion in Ge and Si.- 5. Diffusion in the III–V Compounds.- 6. Diffusion in the II–VI Compounds.- 7. Summary and Conclusions.- References.- 3. Effects of Point Defects on Electrical and Optical Properties of Semiconductors.- 1. Introduction.- 2. Carrier Concentration.- 3. Carrier Mobility.- 4. Minority Carrier Lifetime.- 5. Optical Absorption.- 6. Photoconductivity.- 7. Luminescence.- 8. Conclusion.- References.- 4. Electron Paramagnetic Resonance of Point Defects in Solids, with Emphasis on Semiconductors.- 1. Introduction.- 2. Basic Concepts.- 3. Theory of EPR for Defects in Solids.- 4. Additional Examples.- 5. Auxiliary Techniques.- References.- 5. Phonon-Defect Interaction.- 1. Introduction.- 2. Theoretical Background.- 3. External Interactions.- 4. Internal Interactions.- 5. Summary and Conclusion.- References.- 6. Point Defects in Molecular Solids.- 1. Introduction.- 2. Self-Diffusion.- 3. Experimental Determination of the Formation and Migration Parameters for Point Defects.