Principles and Practice of X-Ray Spectrometric Analysis
Autor E.P. Bertinen Limba Engleză Paperback – 12 oct 2012
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Specificații
ISBN-13: 9781461344186
ISBN-10: 1461344182
Pagini: 1128
Ilustrații: 1080 p.
Dimensiuni: 155 x 235 x 59 mm
Greutate: 1.54 kg
Ediția:Softcover reprint of the original 1st ed. 1975
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
ISBN-10: 1461344182
Pagini: 1128
Ilustrații: 1080 p.
Dimensiuni: 155 x 235 x 59 mm
Greutate: 1.54 kg
Ediția:Softcover reprint of the original 1st ed. 1975
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
Public țintă
ResearchCuprins
I. X-Ray Physics.- 1. Excitation and Nature of X-Rays; X-Ray Spectra.- 2. Properties of X-Rays.- II. The X-Ray Spectrometer, its Components, and their Operation.- 3. X-Ray Secondary-Emission (Fluorescence) Spectrometry; General Introduction.- 4. Excitation.- 5. Dispersion.- 6. Detection.- 7. Measurement.- 8. Pulse-Height Selection; Energy-Dispersive Analysis; Nondispersive Analysis.- 9. Laboratory, Automated, and Special X-Ray Spectrometers.- III. Qualitative and Semiquantitative Analysis.- 10. Qualitative and Semiquantitative Analysis.- IV. Performance Criteria and other Features.- 11. Precision and Error; Counting Statistics.- 12. Matrix Effects.- 13. Sensitivity and Resolution; Spectral-Line Interference.- V. Quantitative Analysis.- 14. Methods of Quantitative Analysis.- 15. Mathematical Correction of Absorption-Enhancement Effects.- VI. Specimen Preparation and Presentation.- 16. Specimen Preparation and Presentation—General; Solids, Powders, Briquets, Fusion Products.- 17. Specimen Preparation and Presentation—Liquids; Supported Specimens.- VII. Unconventional Modes of Operation; Related X-Ray Methods of Analysis.- 18. Measurement of Thickness of Films and Platings.- 19. Selected-Area Analysis.- 20. Other Analytical Methods Based on Emission, Absorption, and Scatter of X-Rays; Other Spectrometric Methods Involving X-Rays.- 21. Electron-Probe Microanalysis.- VIII. Appendixes, Bibliography.- Appendixes.- Appendix 1. Wavelengths of the Principal X-Ray Spectral Lines of the Chemical Elements—K Series.- Appendix 2. Wavelengths of the Principal X-Ray Spectral Lines of the Chemical Elements—L Series.- Appendix 3. Wavelengths of the Principal X-Ray Spectral Lines of the Chemical Elements—M Series.- Appendix 4. Photon Energies of the Principal K and L X-RaySpectral Lines of the Chemical Elements.- Appendix 5. Wavelengths of the K, L, and M X-Ray Absorption Edges of the Chemical Elements.- Appendix 6. K, L, and M X-Ray Excitation Potentials of the Chemical Elements.- Appendix 7A. X-Ray Mass-Absorption Coefficients of the Chemical Elements at 0.1-30 Å.- Appendix 7B. X-Ray Mass-Absorption Coefficients of Elements 2-11 (He-Na) at 40-100 Å.- Appendix 9. Average Values of the K, L, and M Fluorescent Yields of the Chemical Elements.- Appendix 10. X-Ray Spectrometer Analyzer Crystals and Multilayer Films.- Appendix 11A. Glossary of Frequently Used Notation.- Appendix 11B. Prefixes for Physical Units.- Appendix 12. Periodic Table of the Chemical Elements.- Books.- Periodicals.- General Reviews.- Bibliographies.- Tables of Wavelengths, 2? Angles, and Mass-Absorption Coefficients.- Papers and Reports.