Reliability Modelling with Information Measures
Autor N. Unnikrishnan Nair, S.M. Sunoj, G. Rajeshen Limba Engleză Paperback – 8 oct 2024
The first treatise on the subject. It brings together the work that have appeared in journals on different disciplines. It will serve as a text for graduate students and practioners of special studies in information theory, as well as statistics and as a reference book for researchers. The book contains illustrative examples, tables and figures for clarifying the concepts and methodologies, the book is self-contained. It helps students to access information relevant to careers in industry, engineering, applied statistics, etc.
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Specificații
ISBN-13: 9781032314174
ISBN-10: 1032314176
Pagini: 354
Ilustrații: 46
Dimensiuni: 178 x 254 mm
Greutate: 0.65 kg
Ediția:1
Editura: CRC Press
Colecția CRC Press
Locul publicării:Boca Raton, United States
ISBN-10: 1032314176
Pagini: 354
Ilustrații: 46
Dimensiuni: 178 x 254 mm
Greutate: 0.65 kg
Ediția:1
Editura: CRC Press
Colecția CRC Press
Locul publicării:Boca Raton, United States
Public țintă
AcademicCuprins
1. Preliminaries 2. Residual Entropy 3. Entropy of Past Life 4. Generalized Entropies 5. Divergence Measures 6. Inaccuracy 7. Cumulative Entropy 8. Generalized Cumulative Entropy and Divergence
Notă biografică
N. Unnikrishnan Nair gained his Ph.D from the University of Kerala, India and was conferred the degree of Doctor of Humane Letters by Juniata College, USA. He is a Fellow of the Indian Society for Probability and Statistics and its past President. He was also a member of the International Statistical Institute. Nair was the Professor and Chair of the Department of Statistics of the Cochin University of Science and Technology, India, and Dean, Faculty of Science. He also served the University as its Vice Chancellor. He has published six books of which he is the leading author of two recent titles, Quantile-based Reliability Analysis by Birkhauser and Reliability Modeling and Analysis in Discrete Time by Academic Press. He has published over 170 papers in refereed international journals.
S.M. Sunoj gained his Ph.D from the Cochin University of Science and Technology, India. He is the Professor of Department of Statistics, Cochin University of Science and Technology. He has published over 65 papers in refereed international journals. He is an elected member of the International Statistical Institute. He is currently the Associate Editor of the Journal of the Indian Society for Probability and Statistics, India. His areas of research include distribution theory, reliability theory and information measures.
G. Rajesh is the Professor of the Department of Statistics, Cochin University of Science and Technology, India. He received his Ph.D from the Department of Statistics, Cochin University of Science and Technology, India. His main areas of research include distribution theory, information measures and non-parametric inferences. He has published more than 50 research papers in refereed international journals.
S.M. Sunoj gained his Ph.D from the Cochin University of Science and Technology, India. He is the Professor of Department of Statistics, Cochin University of Science and Technology. He has published over 65 papers in refereed international journals. He is an elected member of the International Statistical Institute. He is currently the Associate Editor of the Journal of the Indian Society for Probability and Statistics, India. His areas of research include distribution theory, reliability theory and information measures.
G. Rajesh is the Professor of the Department of Statistics, Cochin University of Science and Technology, India. He received his Ph.D from the Department of Statistics, Cochin University of Science and Technology, India. His main areas of research include distribution theory, information measures and non-parametric inferences. He has published more than 50 research papers in refereed international journals.
Descriere
The book deals with the application of various measures of information like the entropy, divergence, inaccuracy, etc. in modelling lifetimes of devices or equipment in reliability analysis.