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Reliability of Microtechnology: Interconnects, Devices and Systems

Autor Johan Liu, Olli Salmela, Jussi Sarkka, James E. Morris, Per-Erik Tegehall, Cristina Andersson
en Limba Engleză Paperback – 11 oct 2014
Reliability of Microtechnology discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. The book's focus includes but is not limited to reliability issues of interconnects, the methodology of reliability concepts and general failure mechanisms. Specific failure modes in solder and conductive adhesives are discussed at great length. Coverage of accelerated testing, component and system level reliability, and reliability design for manufacturability are also described in detail.
The book also includes exercises and detailed solutions at the end of each chapter.
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Specificații

ISBN-13: 9781489982117
ISBN-10: 1489982116
Pagini: 220
Ilustrații: XIII, 204 p.
Dimensiuni: 155 x 235 x 12 mm
Greutate: 0.31 kg
Ediția:2011
Editura: Springer
Colecția Springer
Locul publicării:New York, NY, United States

Public țintă

Research

Cuprins

Introduction to Reliability and its Importance.- Reliability Metrology.- General Failure Mechanisms of Microsystems.- Solder and Conductive Adhesive Joint Reliability.- Accelerated Testing.- Reliability Design for Manufacturability.- Component Reliability.- System Level Reliability.- Reliability and Quality Management of Microsystem.- Experimental Tools for Reliability Analysis.

Textul de pe ultima copertă

Reliability of Microtechnology discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. The book's focus includes but is not limited to reliability issues of interconnects, the methodology of reliability concepts and general failure mechanisms. Specific failure modes in solder and conductive adhesives are discussed at great length. Coverage of accelerated testing, component and system level reliability, and reliability design for manufacturability are also described in detail. The book also:
  • Discusses the general failure mechanisms of microsystems on a component level
  • Offers comprehensive coverage of solder joint reliability at the microsystems level
  • Analyzes�quality issues and manufacturing at the microsystems level
Reliability of Microtechnology is an ideal volume for researchers and professional engineers working in reliability and manufacturing. The book also includes exercises and detailed solutions at the end of each chapter.

Caracteristici

Discusses the general failure mechanisms of microsystems on a component level Comprehensive coverage of solder joint reliability at the microsystems level Includes accelerated testing of solder joints at the microsystems level Discusses quality issues and manufacturing at the microsystems level Includes supplementary material: sn.pub/extras