Reliability Physics and Engineering: Time-To-Failure Modeling
Autor J. W. McPhersonen Limba Engleză Paperback – 9 iul 2015
Toate formatele și edițiile | Preț | Express |
---|---|---|
Paperback (1) | 577.92 lei 6-8 săpt. | |
Springer International Publishing – 9 iul 2015 | 577.92 lei 6-8 săpt. | |
Hardback (1) | 697.96 lei 6-8 săpt. | |
Springer International Publishing – 10 ian 2019 | 697.96 lei 6-8 săpt. |
Preț: 577.92 lei
Preț vechi: 679.91 lei
-15% Nou
Puncte Express: 867
Preț estimativ în valută:
110.61€ • 116.04$ • 91.76£
110.61€ • 116.04$ • 91.76£
Carte tipărită la comandă
Livrare economică 29 ianuarie-12 februarie 25
Preluare comenzi: 021 569.72.76
Specificații
ISBN-13: 9783319033297
ISBN-10: 3319033298
Pagini: 416
Ilustrații: XVI, 399 p.
Dimensiuni: 155 x 235 x 22 mm
Greutate: 0.58 kg
Ediția:2nd ed. 2013
Editura: Springer International Publishing
Colecția Springer
Locul publicării:Cham, Switzerland
ISBN-10: 3319033298
Pagini: 416
Ilustrații: XVI, 399 p.
Dimensiuni: 155 x 235 x 22 mm
Greutate: 0.58 kg
Ediția:2nd ed. 2013
Editura: Springer International Publishing
Colecția Springer
Locul publicării:Cham, Switzerland
Public țintă
GraduateCuprins
Introduction.- Materials and Device Degradation.- From Material/Device Degradation to Time-To-Failure.- Time-To-Failure Modeling.- Gaussian Statistics – An Overview.- Time-To-Failure Statistics.- Failure Rate Modeling.- Accelerated Degradation.- Acceleration Factor Modeling.- Ramp-To-Failure Testing.- Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits Breakdown (TDDB).- Time-To-Failure Models for Selected Failure Mechanisms In Mechanical Engineering.- Conversion of Dynamical Stresses Into Effective Static Values.- Increasing the Reliability of Device/Product Designs.- Screening.- Heat Generation and Dissipation.- Sampling Plans and Confidence Intervals.- Appendix A: Useful Conversion Factors.- Appendix B: Useful Physical Constants.- Appendix C: Useful Rough Rules-Of-Thumb.- Appendix D: Useful Mathematical Expressions.- Appendix E: Useful Differentials and Definite Integrals.- Appendix F: Free-Energy.- Appendix G: t(1-α/2,ν) Distribution Values.- Appendix H: χ2(P,ν) Distribution Values.- Index.
Notă biografică
Dr. J.W. McPherson is at McPherson Reliability Consulting, LLC.
Textul de pe ultima copertă
Reliability Physics and Engineering provides critically important information that is needed for designing and building reliable cost-effective products.
Key features include:
· Materials/Device Degradation
· Degradation Kinetics
· Time-To-Failure Modeling
· Statistical Tools
· Failure-Rate Modeling
· Accelerated Testing
· Ramp-To-Failure Testing
· Important Failure Mechanisms for Integrated Circuits
· Important Failure Mechanisms for Mechanical Components
· Conversion of Dynamic Stresses into Static Equivalents
· Small Design Changes Producing Major Reliability Improvements
· Screening Methods
· Heat Generation and Dissipation
· Sampling Plans and Confidence Intervals
This textbook includes numerous example problems with solutions. Also, exercise problems along with the answers are included at the end of each chapter.
Reliability Physics and Engineering can be a very useful resource for students, engineers, and materials scientists.
Key features include:
· Materials/Device Degradation
· Degradation Kinetics
· Time-To-Failure Modeling
· Statistical Tools
· Failure-Rate Modeling
· Accelerated Testing
· Ramp-To-Failure Testing
· Important Failure Mechanisms for Integrated Circuits
· Important Failure Mechanisms for Mechanical Components
· Conversion of Dynamic Stresses into Static Equivalents
· Small Design Changes Producing Major Reliability Improvements
· Screening Methods
· Heat Generation and Dissipation
· Sampling Plans and Confidence Intervals
This textbook includes numerous example problems with solutions. Also, exercise problems along with the answers are included at the end of each chapter.
Reliability Physics and Engineering can be a very useful resource for students, engineers, and materials scientists.
Caracteristici
Includes eight new appendices plus three new chapters on screening, heat generation and dissipation, and sampling plans and confidence intervals Provides fundamental reliability physics and engineering tools for building better products Contains statistical training and tools within the text Includes supplementary material: sn.pub/extras
Recenzii
“Reliability Physics and Engineering: Time-to-Failure Modeling … presents good technical insights into advance reliability physics theories and modeling, suitable for both industry and academic practitioners. The authors provide insights into the broad values and technical applications of reliability and safety engineering in this book. … Valuable as a learning tool reliability physics and modeling, its clear relevance to real-world industry practices make it useful for both academics and semiconductor industry practitioners.” (Chong Leong Gan, Life Cycle Reliability and Safety Engineering, Vol. 9, 2020)