Sample Preparation Handbook for Transmission Electron Microscopy
Autor Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Lauben Limba Engleză Carte – 8 iul 2010
The first volume covers general theoretical and practical aspects of the methodologies used for TEM analysis and observation of any sample. The information will help you to choose the best preparative technique for your application taking into account material types, structures, and their properties. Physical properties, material classification, and microstructures are considered together with a thorough description of the physics and chemistry of sample preparation and the main artifacts brought about by mechanical, physical and chemical methods, principles which are also applicable to sample preparation for the SEM, AFM etc.. Also included is a discussion of how to combine techniques for complex sample analysis and to obtain a TEM thin slice. Sample Preparation Handbook for Transmission Electron Microscopy: Methodology will guide you through the most current techniques for successful sample preparation in all fields from materials science to biology.
The second volume, Sample Preparation Handbook for Transmission Electron Microscopy: Techniques, describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis. Compatibility and pre-treatments are also discussed. Experimental conditions and guidelines, options and variations, advantages and constraints, technical hints from the authors’ years of experience, common artifacts, and theoretical issues are all considered. Particular attention is given to the type of material, conditioning, compatible analysis of a given preparation, and risks. This practical and authoritative reference companion deserves a place on the bench in every TEM lab.
Key Features of the Handbook:
- Combines all of the latest techniques for the preparation of mineral to biological samples
- Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level)
- Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis
- Links to a complementary interactive database website which is available to scientists worldwide*
- Written by authors with 100 years of combined experience in electron microscopy
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Specificații
ISBN-13: 9781441960870
ISBN-10: 1441960872
Pagini: 670
Ilustrații: 670 p. 2 volume-set.
Greutate: 1.25 kg
Ediția:2010
Editura: Springer
Colecția Springer
Locul publicării:New York, NY, United States
ISBN-10: 1441960872
Pagini: 670
Ilustrații: 670 p. 2 volume-set.
Greutate: 1.25 kg
Ediția:2010
Editura: Springer
Colecția Springer
Locul publicării:New York, NY, United States
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Public țintă
ResearchCuprins
Volume 1: Methodology
Introduction to materials.- The different observation modes in electron microscopy (SEM, TEM, STEM).- Materials problems and approaches for TEM and TEM/STEM analyses.- Physical and chemical mechanisms of preparation techniques.- Artifacts in transmission electron microscopy.- Selection of preparation techniques based on materials problems and TEM analyses.- Comparisons between techniques.-
Volume 2: Techniques
Introduction.- Preliminary preparation techniques.- Thinning preparation techniques.- Mechanical preparation techniques.- Replica techniques.- Techniques specific to fine particles.- Contrast-enhancement and labeling techniques.-
Introduction to materials.- The different observation modes in electron microscopy (SEM, TEM, STEM).- Materials problems and approaches for TEM and TEM/STEM analyses.- Physical and chemical mechanisms of preparation techniques.- Artifacts in transmission electron microscopy.- Selection of preparation techniques based on materials problems and TEM analyses.- Comparisons between techniques.-
Volume 2: Techniques
Introduction.- Preliminary preparation techniques.- Thinning preparation techniques.- Mechanical preparation techniques.- Replica techniques.- Techniques specific to fine particles.- Contrast-enhancement and labeling techniques.-
Textul de pe ultima copertă
This two-volume Handbook is a comprehensive guide to sample preparation for the transmission electron microscope.
The first volume covers general theoretical and practical aspects of the methodologies used for TEM analysis and observation of any sample. The information will help you to choose the best preparative technique for your application taking into account material types, structures, and their properties. Physical properties, material classification, and microstructures are considered together with a thorough description of the physics and chemistry of sample preparation and the main artifacts brought about by mechanical, physical and chemical methods, principles which are also applicable to sample preparation for the SEM, AFM etc.. Also included is a discussion of how to combine techniques for complex sample analysis and to obtain a TEM thin slice. Sample Preparation Handbook for Transmission Electron Microscopy: Methodology will guide you through the most current techniques for successful sample preparation in all fields from materials science to biology.
The second volume, Sample Preparation Handbook for Transmission Electron Microscopy: Techniques, describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis. Compatibility and pre-treatments are also discussed. Experimental conditions and guidelines, options and variations, advantages and constraints, technical hints from the authors’ years of experience, common artifacts, and theoretical issues are all considered. Particular attention is given to the type of material, conditioning, compatible analysis of a given preparation, and risks. This practical and authoritative reference companion deserves a place on the bench in every TEM lab.
Key Features of the Handbook:
The first volume covers general theoretical and practical aspects of the methodologies used for TEM analysis and observation of any sample. The information will help you to choose the best preparative technique for your application taking into account material types, structures, and their properties. Physical properties, material classification, and microstructures are considered together with a thorough description of the physics and chemistry of sample preparation and the main artifacts brought about by mechanical, physical and chemical methods, principles which are also applicable to sample preparation for the SEM, AFM etc.. Also included is a discussion of how to combine techniques for complex sample analysis and to obtain a TEM thin slice. Sample Preparation Handbook for Transmission Electron Microscopy: Methodology will guide you through the most current techniques for successful sample preparation in all fields from materials science to biology.
The second volume, Sample Preparation Handbook for Transmission Electron Microscopy: Techniques, describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis. Compatibility and pre-treatments are also discussed. Experimental conditions and guidelines, options and variations, advantages and constraints, technical hints from the authors’ years of experience, common artifacts, and theoretical issues are all considered. Particular attention is given to the type of material, conditioning, compatible analysis of a given preparation, and risks. This practical and authoritative reference companion deserves a place on the bench in every TEM lab.
Key Features of the Handbook:
- Combines all of the latest techniques for the preparation of mineral to biological samples
- Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level)
- Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis
- Links to a complementary interactive database website which is available to scientists worldwide*
- Written by authors with 100 years of combined experience in electron microscopy
Caracteristici
First book on TEM sample preparation to combine all the most current techniques for applications ranging from minerals to biological materials
Compares techniques in terms of their limitations, artefacts, application areas, and types of analysis (macroscopic, atomic, or molecular level)
Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis
Complementary interactive database website is available to scientists worldwide
Compares techniques in terms of their limitations, artefacts, application areas, and types of analysis (macroscopic, atomic, or molecular level)
Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis
Complementary interactive database website is available to scientists worldwide
Descriere
Descriere de la o altă ediție sau format:
Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti?c literature detailing speci?c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin spe- men preparation have appeared until this present work, ?rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.
Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti?c literature detailing speci?c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin spe- men preparation have appeared until this present work, ?rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.
Recenzii
From the reviews:
“This textbook is the combined result … of four French microscopists and one Swiss microscopist who use similar TEM techniques for the study of quite different specimens; this explains the very wide scope in terms of techniques covered which distinguishes this book from related previous ones. … this recommendable book is useful for researchers and technicians working in TEM preparation laboratories. … a truly indispensable manual that is guaranteed to make it onto the shelf of almost every laboratory concerned with TEM sample preparation.” (Thomas Walther, Infocus Magazine, Issue 23, September, 2011)
“This textbook is the combined result … of four French microscopists and one Swiss microscopist who use similar TEM techniques for the study of quite different specimens; this explains the very wide scope in terms of techniques covered which distinguishes this book from related previous ones. … this recommendable book is useful for researchers and technicians working in TEM preparation laboratories. … a truly indispensable manual that is guaranteed to make it onto the shelf of almost every laboratory concerned with TEM sample preparation.” (Thomas Walther, Infocus Magazine, Issue 23, September, 2011)