Scanning Microscopy: Symposium Proceedings: ESPRIT Basic Research Series
Editat de Rainer Kassingen Limba Engleză Paperback – 9 feb 2012
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Specificații
ISBN-13: 9783642848124
ISBN-10: 3642848125
Pagini: 224
Ilustrații: X, 207 p.
Dimensiuni: 155 x 235 x 12 mm
Greutate: 0.32 kg
Ediția:Softcover reprint of the original 1st ed. 1992
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria ESPRIT Basic Research Series
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 3642848125
Pagini: 224
Ilustrații: X, 207 p.
Dimensiuni: 155 x 235 x 12 mm
Greutate: 0.32 kg
Ediția:Softcover reprint of the original 1st ed. 1992
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria ESPRIT Basic Research Series
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchCuprins
Performance and Selection Criteria of Critical Components of STM and AFM.- Investigations on the SFM — Tip to Substrate Interaction.- New Scanning Microscopy Techniques: Scanning Noise Microscopy — Scanning Tunneling Microscopy Assisted by Surface Plasmons.- An STM Study of the Oxygenation of Silicon.- Scanning Near Field Optical Microscopy.- Study of Epitaxial Growth by Combination of STM and LEED.- STM Studies of Adsorbates in the Monolayer Range: Ag/Ni(100) and O/Ni(100).- Molecular Imaging with the Scanning Tunneling Microscope.- Imaging of Magnetic Domains in Ferromagnets and Superconductors by Force and Tunneling Microscopy.- Acoustic Microscopy: Pictures to Ponder.- Real-Time Confocal Scanning Microscope — An Optical Instrument with a Better Depth Resolution.- On the Search for Last Frontiers —Scanning Tunneling Microscopy and Related Techniques (Abstract).- STM and AFM Extensions (Abstract).