Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials: Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002: NATO Science Series II: Mathematics, Physics and Chemistry, cartea 186
Editat de Paula M. Vilarinho, Yossi Rosenwaks, Angus Kingonen Limba Engleză Paperback – 21 feb 2005
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Specificații
ISBN-13: 9781402030185
ISBN-10: 1402030185
Pagini: 528
Ilustrații: XXXVII, 488 p.
Dimensiuni: 155 x 235 x 28 mm
Greutate: 0.73 kg
Ediția:2005
Editura: SPRINGER NETHERLANDS
Colecția Springer
Seria NATO Science Series II: Mathematics, Physics and Chemistry
Locul publicării:Dordrecht, Netherlands
ISBN-10: 1402030185
Pagini: 528
Ilustrații: XXXVII, 488 p.
Dimensiuni: 155 x 235 x 28 mm
Greutate: 0.73 kg
Ediția:2005
Editura: SPRINGER NETHERLANDS
Colecția Springer
Seria NATO Science Series II: Mathematics, Physics and Chemistry
Locul publicării:Dordrecht, Netherlands
Public țintă
ResearchCuprins
Fundamentals of Functional Materials.- Functional Materials: Properties, Processing and Applications.- Scaling of Silicon-Based Devices to Submicron Dimensions.- Unsolved Problems in Ferroelectrics for Scanning Probe Microscopy.- Fundamentals of Scanning Probe Techniques.- Principles of Basic and Advanced Scanning Probe Microscopy.- Nanoscale Probing of Physical and Chemical Functionality with Near-Field Optical Microscopy.- Nanoscale Electronic Measurements of Semiconductors Using Kelvin Probe Force Microscopy.- Expanding the Capabilities of the Scanning Tunneling Microscope.- Functions of NC-AFM on Atomic Scale.- Application of Scanning Techniques to Functional Materials.- Scanning Probe Microscopy of Piezoelectric and Transport Phenomena in Electroceramic Materials.- SFM-Based Methods for Ferroelectric Studies.- Scanning Tunneling Spectroscopy.- Nanoinspection of Dielectric and Polarization Properties at Inner and Outer Interfaces in Functional Ferroelectric PZT Thin Films.- Microscale Contact Charging on a Silicon Oxide.- Constructive Nanolithography.- Nanometer-Scale Electronics and Storage.- Contributed papers.- Stm Tips Fabrication for Critical Dimension Measurements.- Scanning Probe Microscopy Characterization of Ferroelectrics Domains and Domains Walls in KTiOPO4.- Imaging Local Dielectric and Mechanical Responses with Dynamic Heterodyned Electrostatic Force Microscopy.- AFM Patterning of SrTiO3?? Thin Films and Device Applications.- Nanoscale Investigation of a Rayleigh Wave on LiNbO3.- Scanning Capacitance Force Microscopy and Kelvin Probe Force Microscopy of Nanostructures Embedded in SiO2.- Electrical Characterisation of III–V Buried Heterostructure Lasers by Scanning Capacitance Microscopy.- Probing the Density of States of High TemperatureSuperconductors with Point Contact Tunneling Spectroscopy.- Annealing Influence on Co Ultrathin Film Morphology in MBE Grown Co/Au Bilayers.- Correlation between the Surface Relief and Interfaces Structure of Fe/Cr Superlattices and Electromagnetic Waves Penetration.- Magnetoresistance and Microstructure of Magnetic Thin Film Multilayers.- SPM Investigation of Thiolated Gold Nanoparticle Patterns Deposited on Different Self-Assembled Substrates.- AFM of Guanine Adsorbed on HOPG under Electrochemical Control.- Dynamics in Model Membranes and DNA-Membrane Complexes Using Temperature Controlled Atomic Force Microscopy.