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Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale de Sergei V. Kalinin

Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale

Autor Sergei V. Kalinin, Alexei Gruverman
en Limba Engleză Hardback – 17 dec 2006
This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.
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Specificații

ISBN-13: 9780387286679
ISBN-10: 0387286675
Pagini: 980
Ilustrații: XL, 980 p. 365 illus., 15 illus. in color.
Dimensiuni: 155 x 235 x 61 mm
Greutate: 1.72 kg
Ediția:2007
Editura: Springer
Colecția Springer
Locul publicării:New York, NY, United States

Public țintă

Research

Descriere

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.
 

Cuprins

SPM Techniques for electrical characterization. -Scanning Tunneling Microscopy and Tunneling Potentiometry. -Scanning Spreading Resistance Microscopy and Scanning Potentiometry. -Scanning Capacitance Microscopy and Nanoimpedance Microscopy. -Scanning Gate Microscopy. -Force-based SPM transport measurements: KPFM, EFM and SIM. -Piezoresponse Force Microscopy. -Ultrasonic Force Microscopy. -Microwave Microscopy. -Near Field Optical Microscopy. -Electrochemical STM. -Advanced SPM Probes for Electrical Characterization. -Electrical and electromechanical imaging at the limits of resolution. -Surface Metal Insulator Transitions. -Spin polarized STM. -STM probing of molecular transport. -Kelvin Probe Force Microscopy of atomic systems. -Single-electron transport in 1D systems. -Theoretical aspects of electrical transport imaging in molecular systems. -Friction on the atomic scale. -Mechanics on the molecular scale. -Electrical SPM characterization of materials and devices. -SPM transport in semiconductors. -SCM and KPFM of semiconductor heterostructures. -SPM characterization of Ferroelectric Materials. -SCM of operational devices. -Photoinduced phenomena in semiconductor heterostructures. -SPM characterization of III-nitrides materials. -Advanced semiconductor metrology by SPM. -Transport in organic electronics. -Electrical nanofabrication. -Direct Nanooxidation. -Ferroelectric Lithography. -Resist-based SPM oxidation techniques. -Charge deposition lithography. -Electrochemical surafecSurface Modification.

Recenzii

From the reviews:
"The stated goal of this book is ‘to provide a comprehensive reference on the nanoscale characterization of electrical and mechanical properties of functional materials by SPM techniques and to make readers aware of tremendous developments in the field in the last decade.’ … The images are particularly clear even to the non-specialist eyes. … The black and white and color figures are of good quality. The photographs are all excellent. … will be helpful to materials scientists in universities and research centers." (Fernande Grandjean and Gary J. Long, Physicalia, Vol. 30 (2), 2008)

Textul de pe ultima copertă

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.

Caracteristici

Appeals to researchers from disciplines as diverse as physics, chemistry, biology, molecular engineering and biotechnology
Presents practical aspects of materials characterization as applied to semiconductors, ferroelectrics, dielectrics, polymers, and biomolecules
Describes electrical SPM-based approaches to nanofabrication and nanolithography