Scanning Tunneling Microscopy II: Further Applications and Related Scanning Techniques: Springer Series in Surface Sciences, cartea 28
Editat de Roland Wiesendanger Contribuţii de W. Baumeister Editat de Hans-Joachim Güntherodt Contribuţii de P. Grütter, R. Guckenberger, T. Hartmann, H. Heinzelmann, H.J. Mamin, E. Meyer, D. W. Pohl, D. Rugar, H. Siegenthaler, U. Staufer, H.K. Wickramasinghe, W. Wiegräbeen Limba Engleză Paperback – 12 feb 2012
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Specificații
ISBN-13: 9783642973659
ISBN-10: 3642973655
Pagini: 324
Ilustrații: XIV, 308 p.
Dimensiuni: 155 x 235 x 17 mm
Greutate: 0.46 kg
Ediția:Softcover reprint of the original 1st ed. 1992
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Series in Surface Sciences
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 3642973655
Pagini: 324
Ilustrații: XIV, 308 p.
Dimensiuni: 155 x 235 x 17 mm
Greutate: 0.46 kg
Ediția:Softcover reprint of the original 1st ed. 1992
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Series in Surface Sciences
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchCuprins
1. Introduction.- 1.1 STM in Electrochemistry and Biology.- 1.2 Probing Small Forces on a Small Scale.- 1.3 Related Scanning Probe Microscopies.- 1.4 Nanotechnology.- References.- 2. STM in Electrochemistry.- 2.1 Principal Aspects.- 2.2 Experimental Concepts for Electrolytic STM at Potential-Controlled Electrodes.- 2.3 Electrochemical Applications of In Situ STM at Potential-Controlled Electrodes.- 2.4 Outlook.- References.- 3. The Scanning Tunneling Microscope in Biology.- 3.1 Instrumentation.- 3.2 Processing of STM Images.- 3.3 Preparation.- 3.4 Applications.- 3.5 Imaging and Conduction Mechanisms.- 3.6 Conclusions.- References.- 4. Scanning Force Microscopy (SFM).- 4.1 Experimental Aspects of Force Microscopy.- 4.2 Forces and Their Relevance to Force Microscopy.- 4.3 Microscopic Description of the Tip—Sample Contact.- 4.4 Imaging with the Force Microscope.- 4.5 Conclusions and Outlook.- References.- 5. Magnetic Force Microscopy (MFM).- 5.1 Basic Principles of MFM.- 5.2 Measurement Techniques.- 5.3 Force Sensors.- 5.4 Theory of MFM Response.- 5.5 Imaging Data Storage Media.- 5.6 Imaging Soft Magnetic Materials.- 5.7 Resolution.- 5.8 Separation of Magnetic and Topographic Signals.- 5.9 Comparison with Other Magnetic Imaging Techniques.- 5.10 Conclusions and Outlook.- References.- 6. Related Scanning Techniques.- 6.1 Historical Background.- 6.2 STM and Electrical Measurements.- 6.3 STM and Optical Effects.- 6.4 Near-Field Thermal Microscopy.- 6.5 Scanning Force Microscopy and Extensions.- 6.6 Conclusion.- References.- 7. Nano-optics and Scanning Near-Field Optical Microscopy.- 7.1 Nano-optics: Optics of Nanometer-Size Structures.- 7.2 Experimental Work.- 7.3 Plasmons and Spectroscopic Effects.- 7.4 Imaging by SNOM.- 7.5 Discussion, Outlook, Conclusions.- References.-8. Surface Modification with a Scanning Proximity Probe Microscope.- 8.1 Overview.- 8.2 Microfabrication with a Scanning Probe Microscope.- 8.3 Investigation of the Fabrication Process.- 8.4 Review of SXM Lithography.- References.