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Progress in Transmission Electron Microscopy 2: Applications in Materials Science de Xiao-Feng Zhang

Progress in Transmission Electron Microscopy 2: Applications in Materials Science: Springer Series in Surface Sciences, cartea 39

Editat de Xiao-Feng Zhang, Ze Zhang
en Limba Engleză Hardback – 18 oct 2001
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.
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Specificații

ISBN-13: 9783540676812
ISBN-10: 3540676813
Pagini: 321
Ilustrații: XIV, 307 p.
Dimensiuni: 155 x 235 x 17 mm
Greutate: 0.64 kg
Ediția:2001
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Series in Surface Sciences

Locul publicării:Berlin, Heidelberg, Germany

Public țintă

Research

Cuprins

1. The Guidance Role of HRTEM in Developing Mesoporous Molecular Sieves.- 2. HREM Study of Carbon Nanoclusters Grown from Carbon Arc-Discharge.- 3. Determining the Helicity of Carbon Nanotubes by Electron Diffraction.- 4. Low-Dimensional Materials and their Microstructures Studied by High-Resolution Electron Microscopy.- 5. Microstructure of High-Tc Superconducting Josephson Junctions.- 6. Swift Heavy Ion Irradiation Damage in Superconductors.- 7. TEM Investigations of Misfit Dislocations in Lattice-Mismatched Semiconductor Heterostructures.- 8. Dislocated Contrast Analysis.- 9. Transmission Electron Cryomicroscopy and Three-Dimensional Reconstruction of Macromolecular Complexes.

Textul de pe ultima copertă

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.

Caracteristici

Reviews the modern developments that have made transmission electron microscopy indispensible for materials research Includes supplementary material: sn.pub/extras