Noncontact Atomic Force Microscopy: Volume 3: NanoScience and Technology
Editat de Seizo Morita, Franz J. Giessibl, Ernst Meyer, Roland Wiesendangeren Limba Engleză Hardback – 2 iun 2015
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Specificații
ISBN-13: 9783319155876
ISBN-10: 3319155873
Pagini: 500
Ilustrații: XXII, 527 p. 256 illus., 159 illus. in color.
Dimensiuni: 155 x 235 x 35 mm
Greutate: 0.94 kg
Ediția:2015
Editura: Springer International Publishing
Colecția Springer
Seria NanoScience and Technology
Locul publicării:Cham, Switzerland
ISBN-10: 3319155873
Pagini: 500
Ilustrații: XXII, 527 p. 256 illus., 159 illus. in color.
Dimensiuni: 155 x 235 x 35 mm
Greutate: 0.94 kg
Ediția:2015
Editura: Springer International Publishing
Colecția Springer
Seria NanoScience and Technology
Locul publicării:Cham, Switzerland
Public țintă
ResearchCuprins
From the Contents: Introduction.- 3D Force-Field Spectroscopy.- Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts.- Spectroscopy and Manipulation Using AFM/STM at Room Temperature.- The Phantom Force - The Influence of a Tunnel Current on Force Microscopy.- Non-Contact Friction.- Magnetic Exchange Force Spectroscopy.
Textul de pe ultima copertă
This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.
Caracteristici
Represents a most advanced state-of-the-art report on atomic force microscopy and scanning tunneling microscopy Deals with the various classes of materials studied at the atomic scale A valuable reference for researchers as well as a text for graduate students Written by leading researchers in the field Includes supplementary material: sn.pub/extras