Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques: NanoScience and Technology
Editat de Bharat Bhushan, Harald Fuchsen Limba Engleză Hardback – 4 noi 2008
Toate formatele și edițiile | Preț | Express |
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Paperback (1) | 575.78 lei 39-44 zile | |
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Springer Berlin, Heidelberg – 4 noi 2008 | 781.22 lei 39-44 zile |
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Specificații
ISBN-13: 9783540850366
ISBN-10: 3540850368
Pagini: 460
Ilustrații: LVI, 236 p. 113 illus., 22 illus. in color.
Dimensiuni: 155 x 235 x 17 mm
Greutate: 0.52 kg
Ediția:2009
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria NanoScience and Technology
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 3540850368
Pagini: 460
Ilustrații: LVI, 236 p. 113 illus., 22 illus. in color.
Dimensiuni: 155 x 235 x 17 mm
Greutate: 0.52 kg
Ediția:2009
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria NanoScience and Technology
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
Professional/practitionerCuprins
Oscillation Control in Dynamic SPM with Quartz Sensors.- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation.- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies.- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science.- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements.- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip.- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations.- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
Recenzii
From the reviews:
"Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. … The editors and their talented authors have been among the leaders in the study of probe methods. … Each chapter captures both the excitement and the importance of the work and conclusions reported, and will make profitable reading for researchers at all experience levels. … All the chapters are supported by extensive lists of references and beautifully illustrated and in color too, also along with graphs, equations etc." (Current Engineering Practice, 2009)
“The articles … are written in sufficient detail, so that university students, researchers and engineers can understand the physics of the instruments, the design and construction of the devices and the cantilevers, the signal processing algorithms, and their use in imaging and the surface characterization of the specimens. … SPM includes a variety of techniques, including scanning near-field optical microscopy, which has interesting applications … . well-written and clearly illustrated. … contain ample experimental data and significant discussion of limitations and artifacts.” (Barry R. Masters, Optics & Photonics News, September, 2009)
"Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. … The editors and their talented authors have been among the leaders in the study of probe methods. … Each chapter captures both the excitement and the importance of the work and conclusions reported, and will make profitable reading for researchers at all experience levels. … All the chapters are supported by extensive lists of references and beautifully illustrated and in color too, also along with graphs, equations etc." (Current Engineering Practice, 2009)
“The articles … are written in sufficient detail, so that university students, researchers and engineers can understand the physics of the instruments, the design and construction of the devices and the cantilevers, the signal processing algorithms, and their use in imaging and the surface characterization of the specimens. … SPM includes a variety of techniques, including scanning near-field optical microscopy, which has interesting applications … . well-written and clearly illustrated. … contain ample experimental data and significant discussion of limitations and artifacts.” (Barry R. Masters, Optics & Photonics News, September, 2009)
Caracteristici
First book summarizing the state of the art of this technique Real industrial applications included Includes supplementary material: sn.pub/extras