Single Event Upset in Dual- and Triple-Well SRAMs
Autor Indranil Chatterjeeen Limba Engleză Paperback – 5 iul 2012
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Specificații
ISBN-13: 9783659123658
ISBN-10: 365912365X
Pagini: 96
Dimensiuni: 152 x 229 x 6 mm
Greutate: 0.15 kg
Editura: LAP LAMBERT ACADEMIC PUBLISHING AG & CO KG
Colecția LAP Lambert Academic Publishing
ISBN-10: 365912365X
Pagini: 96
Dimensiuni: 152 x 229 x 6 mm
Greutate: 0.15 kg
Editura: LAP LAMBERT ACADEMIC PUBLISHING AG & CO KG
Colecția LAP Lambert Academic Publishing
Notă biografică
Indranil Chatterjee received his B.Tech in Electronics Engineering from West Bengal University of Technology, India and MS in Electrical Engineering from Vanderbilt University, USA where he is presently a doctoral student. His research interests include Semiconductor Reliability, Radiation Tolerance of Semiconductor Devices and Novel Devices.