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Spatio-temporal Image Analysis for Longitudinal and Time-Series Image Data: Third International Workshop, STIA 2014, Held in Conjunction with MICCAI 2014, Boston, MA, USA, September 18, 2014, Revised Selected Papers: Lecture Notes in Computer Science, cartea 8682

Editat de Stanley Durrleman, Tom Fletcher, Guido Gerig, Marc Niethammer, Xavier Pennec
en Limba Engleză Paperback – 10 feb 2015
This book constitutes the thoroughly refereed post-conference proceedings of the Third International Workshop on Spatio-temporal Image Analysis for Longitudinal and Time-Series Image Data, STIA 2014, held in conjunction with MICCAI 2014 in Boston, MA, USA, in September 2014.
The 7 papers presented in this volume were carefully reviewed and selected from 15 submissions. They are organized in topical sections named: longitudinal registration and shape modeling, longitudinal modeling, reconstruction from longitudinal data, and 4D image processing.
 
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Specificații

ISBN-13: 9783319149042
ISBN-10: 3319149040
Pagini: 100
Ilustrații: X, 89 p. 35 illus.
Dimensiuni: 155 x 235 x 5 mm
Greutate: 0.15 kg
Ediția:2015
Editura: Springer International Publishing
Colecția Springer
Seriile Lecture Notes in Computer Science, Image Processing, Computer Vision, Pattern Recognition, and Graphics

Locul publicării:Cham, Switzerland

Public țintă

Research

Cuprins

Longitudinal Registration and Shape Modeling.- Longitudinal Modeling.- Reconstruction from Longitudinal Data.- 4D Image Processing.

Textul de pe ultima copertă

This book constitutes the thoroughly refereed post-conference proceedings of the Third International Workshop on Spatio-temporal Image Analysis for Longitudinal and Time-Series Image Data, STIA 2014, held in conjunction with MICCAI 2014 in Boston, MA, USA, in September 2014.
The 7 papers presented in this volume were carefully reviewed and selected from 15 submissions. They are organized in topical sections named: longitudinal registration and shape modeling, longitudinal modeling, reconstruction from longitudinal data, and 4D image processing.
 

Caracteristici

Includes supplementary material: sn.pub/extras